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Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

Published online by Cambridge University Press:  27 August 2014

Max Haider ,
Stephan Uhlemann ,
Peter Hartel  and
Heiko Müller
Max Haider
Affiliation:
CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Stephan Uhlemann
Affiliation:
CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Peter Hartel
Affiliation:
CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Heiko Müller
Affiliation:
CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 378 - 379
Copyright
Copyright © Microscopy Society of America 2014 

References

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[3] TEAM: http://ncem.lbl.gov/TEAM-project/index.html.Google Scholar
[4] Uhlemann, S., et.al. Phys. Rev. Lett. 111, (2013.Google Scholar
[5] PICO: http://www.er-c.org/centre/micfac/frames/titanp.htm.Google Scholar
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