Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

15 Years of Focused Ion Beams at M & M

Abstract

Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

Optimized Detection Limits in FIB-SIMS by Using Reactive Gas Flooding and High Performance Mass Spectrometers

Ion-induced Auger Electron Spectroscopy as a Potential Route to Chemical Focused-Ion Beam Tomography

Advanced Ion Source Technology for High Resolution and Stable FIB Nanofabrication employing Gallium and new Ion Species

Application of a FIB/SEM to Study the Occlusion of Dentine Tubules from a Calcium Sodium Phosphosilicate Bioactive Glass (Novamin)

From Oil Field to Ptychography: Applications of FIB SEM in NanoGeoScience

3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials from the Tagish Lake Meterorite

In situ FIB-SEM Experimentation: from Nanoscale Wetting to Nanofabrication of Gallium-based Liquid Metals

15 Years of Characterizing Titanium Alloys' Microstructure by DBFIB

FIB Lift Out of Columnar Carbon Structures

Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction

Cryo-FIB Minimizes Ga+ Milling Artifacts in Sn

Integration of Cryo-FIB-SEM Imaging into Dynamic Thermo-fluidic Experimentation: Applications to Multifunctional Nanoengineered Surface Design

Ga+ Ions and Xe+ Plasma: Complementary FIBs for Resin-Embedded Life Science Sample Analyses

Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl

Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates

Advantages of Helium and Neon Ion Beams for Intelligent Imaging

Ex situ Lift Out of PFIB Prepared TEM Specimens

In-Situ Quantification of TEM Lamella Thickness and Ga Implantation in the FIB

Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

15 Years of Focused Ion Beams at M & M

Abstract