Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

A New Design for Measuring Potentials in Operando Nanoelectronic Devices by Electron Holography

Vector Field Tomography by Electron Holography

Electron Holographic Tomography of Mean Free Path Lengths at the nm-scale

Hybridization of Off-Axis and In-line High-Resolution Electron Holography

Superposition of Fraunhofer Diffractions from Fork-Shaped Gratings and their Openings with Electron Vortex Beam

Investigation of Effect of Electron Irradiation on Ionic Liquid Using Electron Holography

Electron Holography of the Magnetic Phase Shift of a Current-Carrying Wire

Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography

Lens-Less Foucault Imaging (LLFI) Method for Observing Magnetic Domain Walls

Study of Magnetic Domain Structure in Co(Fe)/Pd Multilayers using Off-axis Electron Holography

Imaging Perpendicular Magnetic Domains in Plan-view Using Lorentz Transmission Electron Microscopy

Evaluation of Doping in GaP Core-Shell Nanowire pn Junction by Off-Axis Electron Holography

Characterization of Metallic and Bimetallic Nanoparticles by Off-Axis Electron Holography

Propagation of Free Electrons Carrying Orbital Angular Momentum Through Magnetic Lenses

15 Years of Focused Ion Beams at M & M

Abstract

FIB Applications: A Historical Perspective

Optimization of High Current Xenon Plasma Ion Beams for Applications in Semiconductor Failure Analysis and Development

High Speed TEM Sample Preparation by Xe FIB

He+ Ions for 3D Imaging

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

1970-2014: From Space Ion Thrusters to Nano-Tools

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

15 Years of Focused Ion Beams at M & M

Abstract