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Experiments and Potentialities for the use of Bessel Beam in Superresolution STEM

Published online by Cambridge University Press:  27 August 2014

Vincenzo Grillo ,
Ebrahim Karimi ,
Roberto Balboni ,
Gian Carlo Gazzadi ,
Stefano Frabboni ,
Erfan Mafakheri  and
Robert W. Boyd
Vincenzo Grillo
Affiliation:
CNR-Istituto Nanoscienze, Centro S3, Via G Campi 213/a, I-41125 Modena, Italy CNR-IMEM, Parco delle Scienze 37a, I-43100 Parma, Italy
Ebrahim Karimi
Affiliation:
Department of Physics, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada
Roberto Balboni
Affiliation:
CNR-IMM Bologna, Via P. Gobetti 101, 40129 Bologna, Italy
Gian Carlo Gazzadi
Affiliation:
CNR-Istituto Nanoscienze, Centro S3, Via G Campi 213/a, I-41125 Modena, Italy
Stefano Frabboni
Affiliation:
CNR-Istituto Nanoscienze, Centro S3, Via G Campi 213/a, I-41125 Modena, Italy Dipartimento FIM, Universitá di Modena e Reggio Emilia, Via G. Campi 213/a, 41125 Modena, Italy
Erfan Mafakheri
Affiliation:
CNR-Istituto Nanoscienze, Centro S3, Via G Campi 213/a, I-41125 Modena, Italy Dipartimento FIM, Universitá di Modena e Reggio Emilia, Via G. Campi 213/a, 41125 Modena, Italy
Robert W. Boyd
Affiliation:
Department of Physics, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada Institute of Optics, University of Rochester, Rochester, New York 14627, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 384 - 385
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Bazhenov, V. Y. & Vasnetsov, M. V., and Soskin, M. S. JETP Lett. 52, 429 (1990).Google Scholar
[2] Verbeeck, J. & Tian, H., and Schattschneider, P. Nature 467, 301 (2010).Google Scholar
[3] Grillo, V., Gazzadi, G.C., Karimi, E., et al., Applied Physics Letters 104, 043109 (2014) [4] Grillo V., E. Karimi, G.C. Gazzadi et al Physical Review X 4, 011013 (2014).Google Scholar
[5] Grillo, V. and Rossi Ultramicroscopy, F. 125 (2013) 112.Google Scholar