Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-29T15:15:40.431Z Has data issue: false hasContentIssue false
  • English
  • Français

Maximum Efficiency STEM Phase Contrast Imaging

Published online by Cambridge University Press:  27 August 2014

Timothy J. Pennycook ,
Andrew R. Lupini ,
Lewys Jones  and
Peter D. Nellist
Timothy J. Pennycook
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK SuperSTEM Laboratory, Daresbury, WA4 4AD, UK
Andrew R. Lupini
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK SuperSTEM Laboratory, Daresbury, WA4 4AD, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 382 - 383
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Lee, S. et al. Ultramicroscopy, 125 (2013), p. 43.Google Scholar
[2] Shibata, N., et al, Nature Physics, 8 (2012), 611.Google Scholar
[3] Kimoto, K., Ishizuka, K. Ultramicroscopy, 111 (2011), p. 1111.Google Scholar
[4] Rodenburg, J. M., McCallum, B. C., Nellist, P. D. Ultramicroscopy, 48, (1993), p. 303.Google Scholar
[5] This research was supported by the EPSRC through the UK National Facility for Aberration-Corrected STEM (SuperSTEM). Research at Oak Ridge National Laboratory was sponsored by the US Department of Energy, Office of Science, Materials Sciences and Engineering Division.Google Scholar