Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Microscopy and Microanalysis for Real-World Problem Solving

Probing Threading Dislocations in a Micrometer-Thick GaN Film by High-Voltage Scanning Transmission Electron Microscopy

Mechanical Synthesis of Fullerene-Graphene/Morphed Graphene Architectures

Correcting an Aberration with a Wire Corrector for SEM

In situ Measurement of Diamond/SiC Interfacial Strength

Advances in Focused Ion Beam Instrumentation and Techniques

Avoiding FIB damage using the “umbrella” method

Ion Induced Bidirectional Bending for Controlled Manipulation at Nanoscale

Integrated Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials

Too Close for Comfort: Creating Two TEM Samples From Areas Separated By 270 Nanometers

Two Methods for Measuring Lamellae Thicknesses In situ for Improved FIB Specimen Preparation

Focused Ion Beams of Xe+, Ar+, O+, and N+: Sputter Rate Trends, Chemical Interactions, and Emerging Applications

Exploring Heterogeneity in Li Battery Electrodes using FIB-SEM Integrated with Raman and TOF-SIMS

Focused Ion Beams in Biology: How the Helium Ion Microscope and FIB/SEMs Help Reveal Nature's Tiniest Structures

Focused Ne+ Beam for Improved SIMS Analysis of Lithium Ion Batteries

Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS)

Advances in Multi-Beam and Multi-Ion FIB-SEM for 3D Correlative Microscopy

Tri-beam FIB Sample Preparation to Study Alterations in Ancient Glass from Broborg, a Vitrified Swedish Hillfort

Combining a Nanoprobing Setup with PFIB Sample Deprocessing

Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode

Advanced FIB-based Preparation of Cryogenically-prepared Specimens for APT Analysis

Residual Stress in Focused Charged Particle Beam-Deposited Materials

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Microscopy and Microanalysis for Real-World Problem Solving

Advances in Focused Ion Beam Instrumentation and Techniques