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In situ Measurement of Diamond/SiC Interfacial Strength

Published online by Cambridge University Press:  05 August 2019

Yuying Zhang ,
Chun-Yen Hsu ,
Yong Zhao ,
Prashant Karandikar  and
Chaoying Ni
Yuying Zhang
Affiliation:
Department of Materials Science and Engineering, University of Delaware, Newark, DE, USA.
Chun-Yen Hsu
Affiliation:
Department of Materials Science and Engineering, University of Delaware, Newark, DE, USA.
Yong Zhao
Affiliation:
Department of Materials Science and Engineering, University of Delaware, Newark, DE, USA.
Prashant Karandikar
Affiliation:
Department of Materials Science and Engineering, University of Delaware, Newark, DE, USA. M cubed Technologies Inc., Newark, DE, USA.
Chaoying Ni*
Affiliation:
Department of Materials Science and Engineering, University of Delaware, Newark, DE, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 848 - 849
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Liu, YS et al. , J. Eur. Ceram. Soc. 34 (2014), p. 3489. doi:10.1016/j.jeurceramsoc.2014.05.042.Google Scholar
[2]Tressler, R et al. , in “Tailoring Multiphase and Composite Ceramics”, (Springer Science & Business Media).Google Scholar
[3]Espinosa, HD et al. , MRS Proceedings (2002), p. 256.Google Scholar
[4]Jackson, KM et al. , J. Microelectromechanical Syst. 14 (2005), p. 664.Google Scholar
[5]This work is supported by the II-VI Foundation. Instrumentation and staff supports from the W. M. Keck Center for Advanced Microscopy and Microanalysis at the University of Delaware are greatly appreciatedGoogle Scholar