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Ion Induced Bidirectional Bending for Controlled Manipulation at Nanoscale

Published online by Cambridge University Press:  05 August 2019

Vivek Garg ,
Rakesh G. Mote ,
Tsengming Chou ,
Amelia Liu ,
Alex De Marco ,
Bhaveshkumar Kamaliya ,
Shi Qiu  and
Jing Fu
Vivek Garg
Affiliation:
IITB-Monash Research Academy, Indian Institute of Technology Bombay, Mumbai, India. Department of Mechanical Engineering, Indian Institute of Technology Bombay, Mumbai, India. Department of Mechanical and Aerospace Engineering, Monash University, Melbourne, Australia.
Rakesh G. Mote*
Affiliation:
Department of Mechanical Engineering, Indian Institute of Technology Bombay, Mumbai, India.
Tsengming Chou
Affiliation:
Laboratory of Multiscale Imaging, Stevens Institute of Technology, Hoboken, NY, USA.
Amelia Liu
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Melbourne, Australia.
Alex De Marco
Affiliation:
Department of Biochemistry and Molecular Biology, Monash University, Melbourne, Australia.
Bhaveshkumar Kamaliya
Affiliation:
IITB-Monash Research Academy, Indian Institute of Technology Bombay, Mumbai, India. Department of Mechanical Engineering, Indian Institute of Technology Bombay, Mumbai, India. Department of Mechanical and Aerospace Engineering, Monash University, Melbourne, Australia.
Shi Qiu
Affiliation:
Department of Mechanical and Aerospace Engineering, Monash University, Melbourne, Australia.
Jing Fu*
Affiliation:
Department of Mechanical and Aerospace Engineering, Monash University, Melbourne, Australia.
*
*Corresponding authors: [email protected], [email protected]
*Corresponding authors: [email protected], [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 852 - 853
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Garg, V, Mote, RG, and Fu, J, Advance Materials Technologies 3 (2018), p. 1800100.Google Scholar
[2]Garg, V, Mote, RG, and Fu, J, Microscopy and Microanalysis 24 (2018), p. 856.Google Scholar
[3]Garg, V et al. , Weaving Nanostructures with Site-Specific Ion Induced Bidirectional Bending (under review).Google Scholar
[4]The work is financially supported by IITB-Monash Research Academy, the Australian Research Council (DP180103955), IRCC (Seed grant: Spons/ME/I14079-1/2014), IIT Bombay, and Tata Consultancy Services (TCS) research scholarship program. The authors acknowledge the use of facilities within the Monash Centre for Electron Microscopy (MCEM), and Melbourne Centre for Nanofabrication (MCN), Victorian Node of the Australian National Fabrication Facility (ANFF).Google Scholar