A new finding is reported for the surface corrugation induced in the superplastic deformation and flow of 3 mol% yttria-partially stabilized tetragonal zirconia polycrystal and β-spodumene glass ceramic, the former including no secondary phase and the latter having a plenty of glassy phase at grain boundaries. A significant test specimen size effect on the resistance to superplastic deformation is also addressed. These findings are related to the microscopic processes and mechanisms of cooperative grain-boundary sliding.

Zn1–xMgxO is an important material for optoelectronic devices. We synthesized this material using a solution-based route. We investigated in detail the structural behavior of this material system using x-ray diffraction and Raman spectroscopy. Mg substitution up to x ≈ 0.10 does not change the crystal structure, as revealed by x-ray diffraction and Raman spectroscopic studies. This synthesis route is also suitable to prepare thin films by spin coating with the possibility of p and n doping.

The characteristics of electrophoretic deposition (EPD) of positively charged particles onto a cathode were investigated using aqueous alumina and zirconia suspensions. The deposition was performed using several kinds of metal substrates at different current densities. For most substrate materials, a large number of macropores appeared in the deposit, and their size increased with the current density due to gas bubble formation. However, no macropores were formed in the deposit on a palladium substrate, regardless of the current density. The green density and sintering properties of the EPD deposits on a palladium substrate from aqueous suspensions were the same as from slip casting. Bubble-free zirconia/alumina laminate composites were also fabricated by EPD from aqueous suspensions.

Nickel-based superalloys have been coated with magnesium oxide (MgO) using ion-beam-assisted deposition (IBAD). This technique produced a well-oriented bi-axially textured MgO template layer with a Ф scan full width half maximum of 6.4°. The layer architecture for these samples was as follows: polished hastelloy C276/amorphous Si3N4/IBAD MgO/ pulsed laser deposited (PLD) Y2O3–ZrO2/PLD CeO2/PLD YBa2Cu3O7?δ. The subsequent heteroepitaxial PLD of 1.5-mm-thick YBCO showed a nominal critical current density of over 1 MA/cm2 (75 K, self-field) along a microbridge and had an in-plane mosaic spread of 4.8° and an out-of-plane spread of 1.3°. These results compare well with our earlier work using IBAD yttria-stabilized zirconia (YSZ) as a template layer and indicate that IBAD MgO is a suitable substitute. Furthermore, these results suggest that IBAD MgO could be adapted to and increase the feasibility of a continuous process to fabricate longer lengths of coated conductors at speeds 100 times faster than that previously realized with IBAD YSZ.

The growth mechanisms of MgB2 films obtained by different methods on various substrates are comparably studied by transport measurements and scanning electron microscopy observations. The analyzed films include those prepared by ex situ postanneal with Tc0 ˜38.8 K and those from in situ anneal with Tc0 ˜24 K. It is clearly observed that the films obtained by the high-temperature reaction of e-beam evaporated B with Mg vapor are formed by the nucleation of independent MgB2 grains at the film surface, indicating that this approach may not be suitable to obtain epitaxial films. A significant oxygen contamination was also present in films obtained from pulsed-laser-deposition-grown precursors, which drag the Tc0 down to 24 K.

The growth and characterization of high-Tc NbN films formed on room temperature substrates by pulsed laser deposition is described. The growth was performed at a high laser power density (>5 × 108 W/cm2), where the enhanced reactivity of species in the plume is proposed as the mechanism for increased nitrogen incorporation in films on unheated substrates. The Tcs were 16.2 K on MgO and 13 K on SiNx/Si substrates. In addition to electrical transport measurements, the films were characterized using RBS and x-ray diffraction. The particulate density on films grown at high power density was significantly reduced, which is correlated with the Nb target having a smoother morphology, characteristic of a quenched molten surface layer in the ablated area.

No abrupt reaction was observed during mechanical alloying (MA) of Ru and Al powder mixtures with an eutectic composition (Ru70Al30). As-milled powders constitute mainly a Ru(Al) solid solution and/or mixture (matrix), and a very small quantity of RuAl. The complete reaction between Ru and Al during MA was speculated to be hampered by excess Ru in Ru70Al30. No exothermic heat release was detected in differential scanning calorimetry for as-milled powders. Precipitation of RuAl from as-milled Ru(Al) matrix was observed after annealing at various temperatures. The phase fraction of Ru and RuAl reaches an approximately equilibrium value after annealing at 1173 K.

The magnetic properties and the domain structure of anisotropic melt-spun SmCo6.5Zr0.5 alloys with C addition was investigated by means of x-ray diffraction (XRD), magnetic measurement, and magnetic force microscopy. The XRD analyses showed that the addition of a few percent of C led to a significant increase in the coercivity and simultaneously affected the characterization of crystalline texture of the ribbons. The easy magnetization c axis changed from parallel to the ribbon plane for SmCo6.5Zr0.5 ribbons to normal to the ribbon plane for SmCo6.5Zr0.5C0.25−0.75 ribbons. An optimal coercivity of 0.92 T was obtained for the SmCo6.5Zr0.5C0.5 ribbon spun at 5 m/s. The corresponding remanence measured normal or parallel to the ribbon plane was 7.1 kGs or 3.1 kGs, respectively. The domain structure was studied by magnetic force microscopey. A strip-shaped domain was observed on the surface of the SmCo6.5Zr0.5 ribbons and the walls lay straight and parallel. For C-doped ribbons, the domain walls formed a maze domain pattern of grains with c axis normal to the ribbon plane. Scanning electron micrographs showed that a dendrite structure was present in the SmCoZr ribbon surface, and C addition caused the above-mentioned dendrite to diminish.

Titanium oxide nanotubes were fabricated by anodic oxidation of a pure titanium sheet in an aqueous solution containing 0.5 to 3.5 wt% hydrofluoric acid. These tubes are well aligned and organized into high-density uniform arrays. While the tops of the tubes are open, the bottoms of the tubes are closed, forming a barrier layer structure similar to that of porous alumina. The average tube diameter, ranging in size from 25 to 65 nm, was found to increase with increasing anodizing voltage, while the length of the tube was found independent of anodization time. A possible growth mechanism is presented.

Superior battery materials LiAlxCo1−xO2 (x = 0.0, 0.1, 0.3, 0.5, and 0.7) were synthesized using a solution-based route at various sintering temperatures (450–800 °C). In this communication, we report on the use of Raman spectroscopy to study effect of composition and sintering temperature on the resulting material. The phase evolutions in LiAlxCo1−xO2 compositions were studied using micro-Raman spectroscopy and a phase diagram is proposed based on the observations. For less Al content, the low-temperature phases of LiAlxCo1−xO2 showed Raman spectra corresponding to a monoclinic (space group C2/m) structure, while a low-temperature spinel (space group Fd3m) phase was observed for 50% or more Al in these compounds. All these compositions exhibited a layered hexagonal (space group R3m) structure when sintered above 700 °C. Raman spectra also revealed residual Co3O4 in the low-temperature forms of LiCoO2 and LiA10.01Co0.9O2.

Hydrogenated microcrystalline silicon (μc-Si:H) grown by a conventional plasma-enhanced chemical vapor deposition from high hydrogen-diluted silane was annealed by increasing the temperature from 25 to 450 °C at a constant rate of 12 °C/min (one annealing cycle). Dark-conductivity activation energy gradually increases with increasing the number of annealing cycle to a saturation value of about 0.6 eV, observed in truly intrinsic μc-Si:H films. For the saturated state, the dark conductivity of the order of 10−8 S/cm was obtained. Little or no change in the oxygen content was observed after the annealing.

Electron microscopy was used to investigate microstructures of diamond single crystals prepared at high temperature and high pressure (HPHT) from the Fe–Ni–C system. Analysis through selected-area electron diffraction pattern suggests that the crystal structure of the HPHT-grown diamond is cubic; polycrystalline diamonds are contained in the diamond. Etch pits on the (111) surface of the diamond by scanning electron microscopy revealed the dislocation motion under the action of applied stress. An array of parallel dislocation lines taken with reflection of [110] was observed directly by transmission electron microscopy (TEM). Fringe distortions and concentric dislocation loops were examined by rotation moiré images, which arose from two overlapping (111) close-packed planes rotated with respect to each other at a 5° angle. The parallel dislocation lines, distorted fringes, and concentric dislocation loops might have derived from the micro-inclusions. The parallel layers with growth cellular interface by TEM provided direct evidence that the diamond grew from solution of carbon in the molten catalyst at HPHT and the growth interface diamond was not stable.

Thin epitaxial TiC and VC films and superlattices have been deposited on MgO(001) by simultaneous sputtering of the metals and evaporation of C60. It was found that epitaxial growth conditions for TiC could be maintained down to a temperature of 100 °C, while the epitaxial growth of VC required 200 °C. Epitaxial VC films were completely relaxed at all growth temperatures, while a change from a relaxed to a strained growth behavior was observed for TiC films. The structural quality of the TiC films was better than for the VC films. A general observation was that a plasma-assisted deposition process yields films with a higher quality and allows epitaxial growth at lower temperatures than for a pure coevaporation process.

The transformation to perovskite phase of Pb0.91La0.09Zr0.65Ti0.35O3 (9/65/35) films on r-sapphire and resulting annealed microstructures were examined by transmission electron microscopy. A random equiaxed polycrystalline grain morphology (approximately 600 nm) was observed after rapid-thermal annealing or furnace annealing when the as-deposited (radio-frequency-magnetron sputtering) films were predominantly pyrochlore. However, an interesting paired-plate structure was revealed after furnace annealing when the as-deposited films were fully perovskite. The average size of such a split precipitate was 35 nm in width and 150 nm in length.

Highly tetrahedral amorphous carbon thin films have exceptional mechanical properties that make them ideal for many challenging wear applications such as protective overcoats for orthopaedic prostheses and aerospace components. However, the use of ta–C in many wear applications is limited due to the poor adhesion and the inability to grow thick films because of the large compressive stress. Here we report on a simple modification of the substrate growth surface by 1-keV ion bombardment using a cathodic vacuum arc (CVA) plasma prior to deposition of ta–C films at 100 eV. The 1-keV C+ ion bombardment created a thin intermixed layer consisting of substrate and carbon atoms. The generation of the intermixed carbide layer improved the adhesion and allowed the growth of thick (several μm) ta–C layers on metallic substrates.

Epitaxial (Pb1−xSrx)TiO3 (PST, x = 4 0.0–0.24) thin films were grown on MgO(001) single-crystal substrates by pulsed laser deposition. General x-ray diffraction techniques including θ–2θ scan and rocking curve were used to determine lattice constants, degree of c-axis orientation, and crystal quality of the tetragonal thin films. The degree of c-axis orientation in the epitaxial PST films increased as Sr concentration (x) increased, which in turn induces the systematic change in the Curie temperature as well as the transformation strain at and below the Curie temperature. An inverse relation between the c-domain abundances and the transformation strains is established.

The thermodynamic stability of the solder channels at a scalloplike Cu6Sn5 layer formed between Sn-containing solders and Cu substrate was evaluated by studying the penetration behavior of the liquid solders into the grain boundaries of a Cu6Sn5 substrate. The orientational relationship between the grains of the Cu6Sn5 layer formed during reflow soldering was also analyzed using the electron backscattered diffraction technique. The results showed that liquid solders penetrate into the grain boundaries at an order of faster speed than the growth rate of the layer, which provided a direct evidence of thermodynamic stability of the channel.

Formation of the icosahedral quasicrystalline phase in conventionally cast Al62Cu25.5Fe12.5 and Al55Cu25.5Fe12.5Be7 alloys were investigated. The icosahedral phase (I-phase) forming ability was greatly improved by partial replacement of Al by 7 at.% Be. The as-cast Al55Cu25.5Fe12.5Be7 alloy consisted of dendritic primary I-phase and interdendritic τ-phase, whereas that of an as-cast Al62Cu25.5Fe12.5 alloy consisted of various phases such as the β-, I-, and τ-phases, together with a small amount of the λ- and η-phases. The kinetic barrier for transformation into single I-phase by heat treatment was greatly reduced in an Al55Cu25.5Fe12.5Be7 alloy. The I-phase in an Al55Cu25.5Fe12.5Be7 alloy has the same face centered icosahedral structure as that in an Al62Cu25.5Fe12.5 alloy and is of high quality without phason strain.

Transition of a SrBi2Ta2O9 precursor film from amorphous to crystalline was inducedby excimer laser irradiation. Both fluorite and perovskite crystalline structures in suchfilms were obtained by excimer laser irradiation at substrate temperatures between 200and 500 °C. Either an addition of excess bismuth in the precursor film or an increasein the substrate temperature enhanced the formation of the perovskite structure in theexcimer laser-induced annealing process, resulting in the perovskite crystalline phase ata relatively lower temperature of 500 °C. Such a low temperature is preferred whenSrBi2Ta2O9 is used in ferroelectric devices. The mechanism involved in thislaser-induced crystallization is also discussed.

TiO2 nanocrystals were prepared by a photo-assisted sol-gel process in which tetrabutoxide titanate was hydrolyzed in acidic medium under ultraviolet irradiation. X-ray diffraction and Raman spectra showed that the as-prepared TiO2 particles without further annealing were well-crystallized anatase. Such TiO2 particles were easily immobilized on dacron cloth and showed very high photocatalytic activity. In contrast, TiO2 particles were ill crystallized and showed lower activity when no light was introduced under otherwise equal conditions.