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Growth of tetragonal BaTiO3 single crystal fibers
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- 31 January 2011, pp. 452-456
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Thermodynamic aspects of amorphous phase formation
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- 03 March 2011, pp. 38-46
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Alpha-recoil damage in zirconolite (CaZrTi2O7)
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- 31 January 2011, pp. 564-576
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The observation of various grain boundary atomic structures in Au by high-resolution electron microscopy
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- 03 March 2011, pp. 47-59
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Observations of order in Pd–Y solid solutions and in Pd7Y
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- 29 June 2016, pp. 781-785
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Electrical and thermal transport properties of the Y1 − x Mx CrO3 system
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- 31 January 2011, pp. 675-684
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Self-propagating high-temperature synthesis of the SiC
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- 31 January 2011, pp. 275-279
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Probability of detection of internal voids in structural ceramics using microfocus radiographya)
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- 31 January 2011, pp. 457-467
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Carbon effects in rapidly solidified Ni3Al
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- 03 March 2011, pp. 60-67
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Novel metal oxides prepared by ingenious synthetic routesa)
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- 31 January 2011, pp. 280-294
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Radiation-induced implantation of polymeric films in metallic substrates
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- 31 January 2011, pp. 577-582
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Cesium and bromine doping into hexagonal boron nitride
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- 31 January 2011, pp. 685-692
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Diffusion markers in thin-film VA13, Co2Al9, CrAl7, MoAl12, and Ni3Al formation
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- 29 June 2016, pp. 786-791
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Raman scattering and x-ray diffraction characterization of amorphous semiconductor multilayer interfaces
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- 31 January 2011, pp. 468-475
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Factors influencing the stability of the tetragonal form of zirconia
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- 31 January 2011, pp. 583-588
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Phase analysis of sintered yttria–zirconia ceramics by x-ray diffraction
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- 31 January 2011, pp. 295-299
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Thermogravimetric analysis of the oxidation-inhibiting behavior of nitrogen-implanted silicon
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- 29 June 2016, pp. 791-796
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Creep behavior of a polycrystalline nickel aluminide: Ni-23.5 at.% A1-0.5 at.% Hf-0.2 at.% B
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- 03 March 2011, pp. 68-72
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Formation of stable dopant interstitials during ion implantation of silicon
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- 31 January 2011, pp. 476-492
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Internal gettering heat treatments and oxygen precipitation in epitaxial silicon wafers
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- 31 January 2011, pp. 693-697
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