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Electronic structure and total energy of diamond/BeO interfaces
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- 31 January 2011, pp. 696-705
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CVD Si3N4 on single crystal SiC: Part I. Characterization and orientation relationship at the interface
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- 29 June 2016, pp. 136-147
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Spatially and spectrally resolved cathodoluminescence of hot-filament chemical-vapor-deposited diamond particles
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- 31 January 2011, pp. 394-403
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Modeling of crack tip dislocation emission in B2 intermetallic alloys
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- 31 January 2011, pp. 919-925
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On the chemical diffusion in layered thin films containing amorphous Co–Zr, Ni–Zr, and Fe–Zr
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- 31 January 2011, pp. 926-933
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Phase relationships in the Ti–Si–C system at high pressures
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- 31 January 2011, pp. 1473-1479
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Epitaxial growth of Cu2O films on MgO by sputtering
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- 31 January 2011, pp. 2828-2832
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Synthesis of yttrium aluminum garnet by reverse strike precipitation
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- 31 January 2011, pp. 706-711
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Nonlinear silicon oxide growth patterns in a gold-silicon system
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- 31 January 2011, pp. 2458-2464
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AFM observations of the surface morphology of metallic glasses Fe78B13Si9 in the early stage of crystallization
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- 31 January 2011, pp. 2126-2130
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Characterization of chemical bonding and physical characteristics of diamond-like amorphous carbon and diamond films
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- 31 January 2011, pp. 404-410
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Surface migration and volume diffusion in the AgGaSe2−Ag2Se system
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- 31 January 2011, pp. 1215-1220
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Crystallization kinetics of binary borosilicate glass composite
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- 31 January 2011, pp. 3103-3111
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Observation and characterization of a twinned monoclinic phase as a product of the solid state decomposition of Nd2Fe14B
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- 31 January 2011, pp. 1762-1768
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Synthesis and characterization of SiC whiskers
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- 29 June 2016, pp. 148-163
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Aerosol synthesis of gadolinium iron garnet particles
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- 31 January 2011, pp. 712-716
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Diffusion bonding of nickel and zirconia: Mechanical properties and interfacial microstructures
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- 31 January 2011, pp. 1480-1488
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Tribological characteristics of polycrystalline diamond films produced by chemical vapor deposition
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- 31 January 2011, pp. 1769-1777
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Observations on the electrical characterization of the heteroepitaxially grown cubic SiC
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- 31 January 2011, pp. 2465-2477
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Data from recording microhardness testers
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- 31 January 2011, pp. 3112-3119
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