Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
Defects in SC lasers and other devices
Research Article
Imaging of spontaneous emission from 980 nm tapered lasers with windowed N-contacts
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- 15 July 2004, pp. 455-459
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Quantitative spectroscopic strain analysis of AlGaAs-based high-power diode laser devices
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 461-464
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Effect of the p+-GaAs contact layer doping level on the gradual degradation of InGaAs/AlGaAs pump lasers
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- 15 July 2004, pp. 465-468
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The study of strain and defects in high power laser diodes by spectroscopically resolved photoluminescence microscopy
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- 15 July 2004, pp. 469-473
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Backside failure analysis of GaAs MMIC ASICs
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 475-477
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Electronic properties through contactless characterisation
Research Article
Microscopic C-V measurements of SOI wafers by scanning capacitance microscopy
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- 15 July 2004, pp. 479-482
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FeB and CrB pair reassociation kinetics in imperfect Si controlled by contactless lifetime scan maps
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 483-485
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Room-temperature diffusion of evaporated Fe atom into SOI materials characterized by scanning Kelvin-SPV method
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 487-489
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Scanning kelvin-probe characterization of heavy metal contamination in patterned SIMOX wafers
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 491-493
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Non-contact C-V measurements of ultra thin dielectrics
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 495-498
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Interface recombination velocity measurement by a contactless microwave technique
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 499-501
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Mapping of minority carrier diffusion length and heavy metal contamination with ultimate surface photovoltage method
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- Published online by Cambridge University Press:
- 15 July 2004, pp. 503-506
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