Powder Diffraction: Volume 25 -

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 25 - June 2010

Contents

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Denver X-Ray Conference

C-2 The Latest Development of Microfocusing Source Based Beam Modules and Their Applications
B. Kim, B. Verman, D. Wilcox, R. Samokyszyn, M. Young, L. Jiang
Published online by Cambridge University Press:

20 May 2016, p. 210
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D-5 A New Geometry for 21st Century Diffraction
K. D. Rogers, J. Rogers, A. Dicken, P. Evans, J. W. Chan, X. Wang
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20 May 2016, p. 210
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D-15 A New Approach to High Throughput Diffraction Analysis
S. Roncallo, S. A. Ansari, D. W. Lane, O. Karimi, K. D. Rogers, J. M. Gregoire
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20 May 2016, p. 210
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D-24 Design and Development of Compound X-ray Optical Systems
B. Verman, D. Wilcox, B. Kim, R. Samokyszyn, M. Young, Y. Hua, L. Jiang, T. Ozawa, R. Matsuo, K. Omote, T. Osakabe, M. Aoyagi, K. Sumii
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20 May 2016, p. 210
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D-44 X-ray Source, Optic and Detector for Two-Dimensional XRD
B. B. He
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20 May 2016, p. 210
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D-45 Development of In Situ X-ray Diffraction System for Hydrothermal Reaction and Its Application to Autoclaved Aerated Concrete Formation
J. Kikuma, M. Tsunashima, T. Ishikawa, S. Matsuno, K. Matsui, A. Ogawa
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20 May 2016, p. 210
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D-61 New Instrumentation for X-ray Material Research
H. R. Ress, B. B. He, B. Jones, G. Vanhoyland
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20 May 2016, p. 210
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D-62 Clever Diffractometers with the Incoatec Microfocus Source
T. Samtleben, C. Michaelsen, B. Hasse, J. Graf, J. Wiesmann
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20 May 2016, p. 210
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D-66 High Brilliance Microfocus Sources with Scatterless Collimation for Improved SAXS
S. Rodrigues, P. Panine, V. Roger, P. Høghøj
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20 May 2016, p. 210
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D-86 Empyrean—The World of X-ray Diffraction Is No Longer Flat
M. Fransen
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20 May 2016, p. 210
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F-9 Combined X-ray Imaging and Spectroscopy—A Low Cost Solution
D. Lane, J. Lyons
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20 May 2016, p. 210
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F-10 High Speed 2D and 3D MXRF—Imaging with Bench Top Technology
U. Waldschlaeger, M. Haschke
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20 May 2016, p. 210
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F-16 Readout ASICs for Silicon Drift Detectors
L. Bombelli, C. Fiorini, A. Celani, A. Longoni, R. Alberti, T. Frizzi, R. Nava
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20 May 2016, p. 211
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F-51 Bruker EDXRF New Product Releases and News 2010
A. Seyfarth, A. Gross, J. Patterson, B. Kaiser
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20 May 2016, p. 211
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F-57 Excellent Performance with 100 mm2 Silicon Drift Detectors for X-rays and Gamma Radiation
A. Niculae, A. Liebel, A. Simsek, O. Jaritschin, H. Soltau, A. Liebel, R. Eckhardt, G. Lutz, S. Jeschke, P. Lechner, L. Strüder, F. Schopper, G. Schaller, C. Fiorini
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20 May 2016, p. 211
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F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF
M. Kraemer, T. Holz, R. Dietsch, D. Weissbach, G. Falkenberg, R. Simon, U. Fittschen, T. Krugmann, B. Beckhoff
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20 May 2016, p. 211
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F-73 High-Definition XRF — Multiple Monochromatic Beams EDXRF — For Consumer Product Analysis
Z. W. Chen, S. Nayar
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20 May 2016, p. 211
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D-94 Invited—In-Situ and Time Resolved Small-Angle X-ray Scattering
B. G. Landes, B. J. Kern, T. J. Hermel-Davidock, M. Demirors, J. D. Weinhold, G. R. Marchand, K. Nanjundiah, R. E. Drumright, S. J. Weigand
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20 May 2016, p. 211
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D-84 Invited—The Structure and Hydrogen Bonding of a Highly Disordered Fiber
J. D. Londono, A. D. English, P. Langan, Y. Nishiyama, T. Forsyth
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20 May 2016, p. 211
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D-29 Investigation of Microstructural Changes in Impacted Polyurea Coatings Using Small-Angle X-ray Scattering (SAXS)
E. Balizer, J. Fedderly, G. Lee, S. Bartyczak, W. Mock
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20 May 2016, p. 211
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Page 6 of 11

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5
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7
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Powder Diffraction

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Volume 25 - June 2010

Denver X-Ray Conference

C-2 The Latest Development of Microfocusing Source Based Beam Modules and Their Applications

D-5 A New Geometry for 21st Century Diffraction

D-15 A New Approach to High Throughput Diffraction Analysis

D-24 Design and Development of Compound X-ray Optical Systems

D-44 X-ray Source, Optic and Detector for Two-Dimensional XRD

D-45 Development of In Situ X-ray Diffraction System for Hydrothermal Reaction and Its Application to Autoclaved Aerated Concrete Formation

D-61 New Instrumentation for X-ray Material Research

D-62 Clever Diffractometers with the Incoatec Microfocus Source

D-66 High Brilliance Microfocus Sources with Scatterless Collimation for Improved SAXS

D-86 Empyrean—The World of X-ray Diffraction Is No Longer Flat

F-9 Combined X-ray Imaging and Spectroscopy—A Low Cost Solution

F-10 High Speed 2D and 3D MXRF—Imaging with Bench Top Technology

F-16 Readout ASICs for Silicon Drift Detectors

F-51 Bruker EDXRF New Product Releases and News 2010

F-57 Excellent Performance with 100 mm2 Silicon Drift Detectors for X-rays and Gamma Radiation

F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF

F-73 High-Definition XRF — Multiple Monochromatic Beams EDXRF — For Consumer Product Analysis

D-94 Invited—In-Situ and Time Resolved Small-Angle X-ray Scattering

D-84 Invited—The Structure and Hydrogen Bonding of a Highly Disordered Fiber

D-29 Investigation of Microstructural Changes in Impacted Polyurea Coatings Using Small-Angle X-ray Scattering (SAXS)

Powder Diffraction

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Volume 25 - June 2010

Denver X-Ray Conference