Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-23T09:22:27.198Z Has data issue: false hasContentIssue false

D-15 A New Approach to High Throughput Diffraction Analysis

Published online by Cambridge University Press:  20 May 2016

S. Roncallo
Affiliation:
Cranfield University, Shrivenham, Swindon, Wiltshire, UK
S. A. Ansari
Affiliation:
Cranfield University, Shrivenham, Swindon, Wiltshire, UK
D. W. Lane
Affiliation:
Cranfield University, Shrivenham, Swindon, Wiltshire, UK
O. Karimi
Affiliation:
Cranfield University, Cranfield, Bedfordshire, UK
K. D. Rogers
Affiliation:
Cranfield University, Cranfield, Bedfordshire, UK
J. M. Gregoire
Affiliation:
Cornell University, Ithaca, NY

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)