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F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF

Published online by Cambridge University Press:  20 May 2016

M. Kraemer ,
T. Holz ,
R. Dietsch ,
D. Weissbach ,
G. Falkenberg ,
R. Simon ,
U. Fittschen ,
T. Krugmann  and
B. Beckhoff
M. Kraemer
Affiliation:
AXO Dresden GmbH, Heidenau, Germany
T. Holz
Affiliation:
AXO Dresden GmbH, Heidenau, Germany
R. Dietsch
Affiliation:
AXO Dresden GmbH, Heidenau, Germany
D. Weissbach
Affiliation:
AXO Dresden GmbH, Heidenau, Germany
G. Falkenberg
Affiliation:
Hasylab at DESY, Hamburg, Germany
R. Simon
Affiliation:
FZ Karlsruhe, Eggerstein, Germany
U. Fittschen
Affiliation:
Universität Hamburg, Hamburg, Germany
T. Krugmann
Affiliation:
Universität Hamburg, Hamburg, Germany
B. Beckhoff
Affiliation:
PTB Berlin, Berlin, Germany
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 25 , Issue 2 , June 2010 , pp. 211
Copyright
Copyright © Cambridge University Press 2010

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