Powder Diffraction: Volume 25 -

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 25 - June 2010

Contents

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Denver X-Ray Conference

F-72 Invited—TXRF- A Versatile Tool for Trace Element Analysis: A Review
P. Wobrauschek
Published online by Cambridge University Press:

20 May 2016, p. 220
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F-31 Discovering the Selenium Metabolism and Its Impact for Health Prevention by TXRF
A. Gross, H. Stosnach, K. Renko, T. Behrends, L. Schomburg
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20 May 2016, p. 220
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F-76 Invited—Different Applications of Polycapillaries to X-ray Spectroscopy
H. J. Sánchez, R. D. Pérez, C. A. Pérez
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20 May 2016, p. 220
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F-33 Trace Element Detection Using Monochromatic Wavelength Dispersive X-ray Fluorescence
G. J. Havrilla, M. Collins, V. Montoya, Z. Chen, F. Wei
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20 May 2016, p. 220
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F-74 Invited—Analysis of Indoor Fine Dust
U. E. A. Fittschen, A. Rehmers, M. Santen, M. Wesselmann
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20 May 2016, p. 221
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F-62 Characterization of Nanoparticles with X-ray Spectrometry Under Grazing Incidence Conditions
F. Reinhardt, B. Beckhoff, B. Pollakowski, H. Bresch, S. Seeger
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20 May 2016, p. 221
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F-65 Assessment of Advanced X-ray GIXRF Methodology Applied to the Characterization of Ultra Shallow Junctions
P. Hönicke, B. Beckhoff, M. Kolbe, D. Giuberton, G. Pepponi, J. van den Berg
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20 May 2016, p. 221
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F-49 Comparison of X-ray and Mass Spectroscopy Based Analytical Methods for Detection of Organic Contamination
A. Nutsch, A. Leibold, L. Pfitzner, M. Otto, B. Beckhoff, M. Müller, G. Bedana, G. Borionetti, G. Guerinoni, M. -L. Polignano, D. Codegoni, S. Grasso, D. De Simone
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20 May 2016, p. 221
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Powder Diffraction

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Volume 25 - June 2010

Denver X-Ray Conference

F-72 Invited—TXRF- A Versatile Tool for Trace Element Analysis: A Review

F-31 Discovering the Selenium Metabolism and Its Impact for Health Prevention by TXRF

F-76 Invited—Different Applications of Polycapillaries to X-ray Spectroscopy

F-33 Trace Element Detection Using Monochromatic Wavelength Dispersive X-ray Fluorescence

F-74 Invited—Analysis of Indoor Fine Dust

F-62 Characterization of Nanoparticles with X-ray Spectrometry Under Grazing Incidence Conditions

F-65 Assessment of Advanced X-ray GIXRF Methodology Applied to the Characterization of Ultra Shallow Junctions

F-49 Comparison of X-ray and Mass Spectroscopy Based Analytical Methods for Detection of Organic Contamination

Powder Diffraction

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Volume 25 - June 2010

Denver X-Ray Conference