Powder Diffraction: Volume 25 -

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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< Back to all issues

Volume 25 - June 2010

Contents

Page 9 of 11

Denver X-Ray Conference

F-54 Development of Quantification Method Using Fundamental Parameter Method for EDXRF
S. Hara, N. Kawahara, T. Matsuo, M. Doi
Published online by Cambridge University Press:

20 May 2016, p. 216
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F-59 Characterization of Gemstones by Multiple Excitation EDXRF
M. Haller, V. Rößiger, A. Peretti, D. Günther
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20 May 2016, p. 216
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F-19 Invited—Analysis of Meissen Ceramics from the Hoffmeister Collection by HH-XRF
A. J. Shortland, K. Domoney, S. Kuhn
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20 May 2016, p. 216
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C-8 Invited—Analyzing Stratigraphy with a Dual XRD/XRF Instrument
G. Chiari
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20 May 2016, p. 216
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D-3 An Archaeologist's Dilemma
K. D. Rogers, S. Beckett, S. Kuhn, A. Chamberlain, J. Clement
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20 May 2016, p. 216
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F-50 Invited—Incorporating the Concept of Secondary Targets in Handheld X-ray Fluorescence to Increase Sensitivity of Minor Elements
C. McGlinchey, B. Kaiser, T. Howe
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20 May 2016, p. 216
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F-79 Characterization of Silver Gelatin Fiber Based Photographic Papers using X-ray Fluorescence Spectroscopy
A. Martins, C. McGlinchey, L. A. Daffner, P. Messier, A. Chapman
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20 May 2016, p. 216
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D-74 Invited— High-Resolution Powder X-ray Diffraction Study of Complex Minerals
S. M. Antao
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20 May 2016, p. 216
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D-22 Crystal Structures of BaSrR4Zn2O10, R = La, Nd, Sm, Eu
J. A. Kaduk, W. Wong-Ng
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20 May 2016, p. 217
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D-60 Detection and Quantification of Passivation Layers in Electrochemical Inert Anodes by In-Situ and Ex-Situ Diffraction
M. R. Rowles, K. McGregor, G. A. Snook, I. C. Madsen, N.V.Y. Scarlett, M. Lanyon, A. Urban, M. J. Styles, D. P. Riley
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20 May 2016, p. 217
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C-6 Characterization of X-ray Powder Diffraction Data of BaxSr1−xSo4 (0≤x≤1) by Rietveld Refinement
S. R. Zaidi, H. Sitepu, S. Shen, N. Al-Yami
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20 May 2016, p. 217
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D-77 XRD Anisotropic Broadening of Nano-Particles
Y. Wang, S. L. I. Chan, Y. R. Shen, R. Amal, K. Kiatkittipong
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20 May 2016, p. 217
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D-19 Differences between Near-Surface and Bulk Preferred Orientation with Powder Diffraction Data of Molybdite (MoO3) and Calcite (CaCo3)
H. Sitepu, B. H. O'Connor, D. Li
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20 May 2016, p. 217
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D-13 Computational Texture Analysis with MTEX
R. Hielscher, F. Bachmann, H. Schaeben
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20 May 2016, p. 217
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D-20 Invited—Three Dimensional X-ray Diffraction Microscopy
L. Margulies, H. F. Poulsen, S. Schmidt, D. J. Jensen, G. Vaughan, J. Wright
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20 May 2016, p. 217
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D-30 Invited—Nanoscale Scanning Probe Diffraction Microscopy at the Hard X-ray Nanoprobe Beamline
M. Holt, S. Hruszkewycz, R. Winarski, V. Rose, J. Maser
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20 May 2016, p. 217
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D-81 Multi-Dimensional X-ray Investigation of Materials—Ranging from Classical Bragg-Brentano Type Diffraction Phase Analysis to 3 Dimensional CT Microstructure Analysis
H. Pöllmann, R. Maier, U. Riedl, G. Blaj
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20 May 2016, p. 217
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D-73 High Resolution X-ray Diffraction of III-Nitride Wide Bandgap Semiconductors
Q. Sun, B. Leung, J. Han
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20 May 2016, p. 218
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D-17 High-Resolution Reciprocal Space Mapping of InGaAs/GaAs Structures: From Pseudomorphic to Fully Relaxed State
A. Ulyanenkov, F. Rinaldi, S. Menzel, A. Benediktovich, A. Zhilik, I. Feranchuk, K. Saito
Published online by Cambridge University Press:

20 May 2016, p. 218
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D-36 In-Plane Diffraction Analysis for Twist/Twin Structure of Non-Polar A-Plane GaN
Y. -i. Jang, K. -h. Park, K. -h. Bang
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20 May 2016, p. 218
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Page 9 of 11

Powder Diffraction

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Volume 25 - June 2010

Denver X-Ray Conference

F-54 Development of Quantification Method Using Fundamental Parameter Method for EDXRF

F-59 Characterization of Gemstones by Multiple Excitation EDXRF

F-19 Invited—Analysis of Meissen Ceramics from the Hoffmeister Collection by HH-XRF

C-8 Invited—Analyzing Stratigraphy with a Dual XRD/XRF Instrument

D-3 An Archaeologist's Dilemma

F-50 Invited—Incorporating the Concept of Secondary Targets in Handheld X-ray Fluorescence to Increase Sensitivity of Minor Elements

F-79 Characterization of Silver Gelatin Fiber Based Photographic Papers using X-ray Fluorescence Spectroscopy

D-74 Invited— High-Resolution Powder X-ray Diffraction Study of Complex Minerals

D-22 Crystal Structures of BaSrR4Zn2O10, R = La, Nd, Sm, Eu

D-60 Detection and Quantification of Passivation Layers in Electrochemical Inert Anodes by In-Situ and Ex-Situ Diffraction

C-6 Characterization of X-ray Powder Diffraction Data of BaxSr1−xSo4 (0≤x≤1) by Rietveld Refinement

D-77 XRD Anisotropic Broadening of Nano-Particles

D-19 Differences between Near-Surface and Bulk Preferred Orientation with Powder Diffraction Data of Molybdite (MoO3) and Calcite (CaCo3)

D-13 Computational Texture Analysis with MTEX

D-20 Invited—Three Dimensional X-ray Diffraction Microscopy

D-30 Invited—Nanoscale Scanning Probe Diffraction Microscopy at the Hard X-ray Nanoprobe Beamline

D-81 Multi-Dimensional X-ray Investigation of Materials—Ranging from Classical Bragg-Brentano Type Diffraction Phase Analysis to 3 Dimensional CT Microstructure Analysis

D-73 High Resolution X-ray Diffraction of III-Nitride Wide Bandgap Semiconductors

D-17 High-Resolution Reciprocal Space Mapping of InGaAs/GaAs Structures: From Pseudomorphic to Fully Relaxed State

D-36 In-Plane Diffraction Analysis for Twist/Twin Structure of Non-Polar A-Plane GaN

Powder Diffraction

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Volume 25 - June 2010

Denver X-Ray Conference