Research Article
Electronic and Mechanical Properties of Dislocations in Semiconductors
-
- Published online by Cambridge University Press:
- 15 February 2011, 257
-
- Article
- Export citation
Dislocation Defect States in Deformed Silicon
-
- Published online by Cambridge University Press:
- 15 February 2011, 273
-
- Article
- Export citation
Characterization of Dislocations and Interfaces in Semiconductors by High Resolution Electron Microscopy
-
- Published online by Cambridge University Press:
- 15 February 2011, 279
-
- Article
- Export citation
Silicon-Sapphire Interface: A High Resolution Electron Microscopy Study
-
- Published online by Cambridge University Press:
- 15 February 2011, 285
-
- Article
- Export citation
Defect Structure of the Epitaxial Pd2 Si-Silicon Interface
-
- Published online by Cambridge University Press:
- 15 February 2011, 291
-
- Article
- Export citation
Characterization of Defects in Silicon Ribbons By Combined Ebic and Hvem
-
- Published online by Cambridge University Press:
- 15 February 2011, 297
-
- Article
- Export citation
Ebic Investigation of Hydrogen Passivated Structural Defects in Efg Silicon Ribbon
-
- Published online by Cambridge University Press:
- 15 February 2011, 303
-
- Article
- Export citation
Swirl Defects in As-Grown Silicon Crystals
-
- Published online by Cambridge University Press:
- 15 February 2011, 309
-
- Article
- Export citation
Real-Time X-Ray Topographic Observation of Melting and Growth of Silicon Crystals
-
- Published online by Cambridge University Press:
- 15 February 2011, 317
-
- Article
- Export citation
Oxygen, Oxidation Stacking Faults, and Related Phenomena in Silicon
-
- Published online by Cambridge University Press:
- 15 February 2011, 333
-
- Article
- Export citation
Enhanced Diffusion and Formation of Defects During Thermal Oxidation*
-
- Published online by Cambridge University Press:
- 15 February 2011, 355
-
- Article
- Export citation
Precipitation of Oxygen and Intrinsic Gettering in Silicon
-
- Published online by Cambridge University Press:
- 15 February 2011, 367
-
- Article
- Export citation
The Effect of Annealing Temperature on the Morphology of Stacking Faults in Czochralski Silicon
-
- Published online by Cambridge University Press:
- 15 February 2011, 381
-
- Article
- Export citation
The Effect of Carbon on the Precipitation of Oxygen in Czochralski Silicon
-
- Published online by Cambridge University Press:
- 15 February 2011, 387
-
- Article
- Export citation
Electron Microscope Characterization of Pulse Annealed Semiconductors
-
- Published online by Cambridge University Press:
- 15 February 2011, 393
-
- Article
- Export citation
Melting and Laser Annealing in Semiconductors using 0.485 μm and 0.193 μm Pulsed Lasers*
-
- Published online by Cambridge University Press:
- 15 February 2011, 409
-
- Article
- Export citation
Analysis of Defects in Laser Annealed GaAs*
-
- Published online by Cambridge University Press:
- 15 February 2011, 421
-
- Article
- Export citation
Convection and Constitutional Supercooling Cells in Laser Annealed Silicon*
-
- Published online by Cambridge University Press:
- 15 February 2011, 431
-
- Article
- Export citation
Tem Investigation of the Microstructure in Laser-Crystallized Ge Films
-
- Published online by Cambridge University Press:
- 15 February 2011, 439
-
- Article
- Export citation
Raman Scattering Characterization of Bonding Defects in Silicon
-
- Published online by Cambridge University Press:
- 15 February 2011, 445
-
- Article
- Export citation