Cross-Cutting Symposia
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Lossless Image Compression for 4D-STEM Datasets
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- 22 July 2022, pp. 3060-3061
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Automated Acquisition and Deep Learning of 2D Materials on the Million-Atom Scale
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- 22 July 2022, pp. 3062-3063
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A Comparison of 3D and 2D U-Net Convolutional Networks for Segmentation in FIB-SEM Imagery
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- 22 July 2022, pp. 3064-3066
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Automatic Nondestructive Detection of Damages in Thermal Barrier Coatings Using Image Processing and Machine Learning
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- 22 July 2022, pp. 3068-3072
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Data Analytics: Quality Measures for Image Information Content
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- 22 July 2022, pp. 3074-3075
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Fast Automatic Point Spread Function Deconvolution Using Edge Detection
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- 22 July 2022, pp. 3076-3077
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Finding Features from Microscopes to Simulations Via Ensemble Learning and Atomic Manipulation
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- 22 July 2022, pp. 3078-3080
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Software Package for Efficient Creation of Training Data for Machine Learning Classifiers from Micrographs
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- 22 July 2022, pp. 3082-3083
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Automated Design of Electron Mirrors for Multipass Electron Microscopy and 4D-STEM+EELS
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- 22 July 2022, pp. 3084-3085
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Machine Learning Prediction of Valence and Coordination from EELS Spectra of Iron Containing Compounds
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- 22 July 2022, pp. 3086-3087
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Traceable Measurements using a Metrology Scanning Electron Microscope
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- 22 July 2022, pp. 3088-3090
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High Throughput 3D Volumes Data Acquisition Using AI
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- 22 July 2022, pp. 3092-3093
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Infrastructure for Analysis of Large Microscopy and Microanalysis Data Sets
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- 22 July 2022, pp. 3094-3096
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Synthetic Data Curation Strategies for Robust Model Development: A Case Study with HRTEM Micrograph Segmentation
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- 22 July 2022, pp. 3098-3100
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Intelligent and Automatic Parameter Optimization for High-resolution Electron Ptychography
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- 22 July 2022, pp. 3102-3103
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Efficient Memory Storage and Linear Parallel Scaling for Large-Scale Electron Ptychography
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- 22 July 2022, pp. 3104-3106
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Automatic and Quantitative Measurement of Spectrometer Aberrations in Monochromated EELS
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- 22 July 2022, pp. 3108-3110
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Exploiting Automatic Image Processing and In-situ Transmission Electron Microscopy to Understand the Stability of Supported Nanoparticles
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- 22 July 2022, pp. 3112-3113
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Python and FPGA-based Workflow for Automated and Interoperable Scanning Probe Microscopy
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- 22 July 2022, pp. 3114-3115
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Compressed STEM Simulations
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- 22 July 2022, pp. 3116-3117
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