Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - April 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis

Lossless Image Compression for 4D-STEM Datasets

Automated Acquisition and Deep Learning of 2D Materials on the Million-Atom Scale

A Comparison of 3D and 2D U-Net Convolutional Networks for Segmentation in FIB-SEM Imagery

Automatic Nondestructive Detection of Damages in Thermal Barrier Coatings Using Image Processing and Machine Learning

Data Analytics: Quality Measures for Image Information Content

Fast Automatic Point Spread Function Deconvolution Using Edge Detection

Finding Features from Microscopes to Simulations Via Ensemble Learning and Atomic Manipulation

Software Package for Efficient Creation of Training Data for Machine Learning Classifiers from Micrographs

Automated Design of Electron Mirrors for Multipass Electron Microscopy and 4D-STEM+EELS

Machine Learning Prediction of Valence and Coordination from EELS Spectra of Iron Containing Compounds

Traceable Measurements using a Metrology Scanning Electron Microscope

High Throughput 3D Volumes Data Acquisition Using AI

Infrastructure for Analysis of Large Microscopy and Microanalysis Data Sets

Synthetic Data Curation Strategies for Robust Model Development: A Case Study with HRTEM Micrograph Segmentation

Intelligent and Automatic Parameter Optimization for High-resolution Electron Ptychography

Efficient Memory Storage and Linear Parallel Scaling for Large-Scale Electron Ptychography

Automatic and Quantitative Measurement of Spectrometer Aberrations in Monochromated EELS

Exploiting Automatic Image Processing and In-situ Transmission Electron Microscopy to Understand the Stability of Supported Nanoparticles

Python and FPGA-based Workflow for Automated and Interoperable Scanning Probe Microscopy

Compressed STEM Simulations

Microscopy and Microanalysis

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Volume 28 - April 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis