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Intelligent and Automatic Parameter Optimization for High-resolution Electron Ptychography

Published online by Cambridge University Press:  22 July 2022

Michael C. Cao ,
Zhen Chen ,
Yi Jiang  and
Yimo Han
Michael C. Cao
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, TX, United States
Zhen Chen
Affiliation:
School of Materials Science and Engineering, Tsinghua University, Beijing, China
Yi Jiang*
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL, United States
Yimo Han*
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, TX, United States
*
*Corresponding author: [email protected]
*Corresponding author: [email protected]

Abstract

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Type
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 3102 - 3103
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Copyright
Copyright © Microscopy Society of America 2022

References

Jiang, Yi, et al. Nature 559.7714 (2018), p. 343-349. doi:10.1038/s41586-018-0298-5CrossRefGoogle Scholar
Chen, Zhen, et al. Nature communications 11 (2020), p. 1-10. doi:10.1038/s41467-020-16688-6Google Scholar
Tate, Mark W., et al. Microscopy and Microanalysis 22.1 (2016), p. 237-249. doi:10.1017/S1431927615015664CrossRefGoogle Scholar
Bergstra, James, et al. Advances in neural information processing systems 24 (2011).Google Scholar
Zhang, Chenyu, et al. Microscopy and Microanalysis 27.S1 (2021), p. 810-812. doi:10.1017/S1431927621003214CrossRefGoogle Scholar
The authors acknowledge funding from the Welch Foundation (C-2065-20210327).Google Scholar