Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - April 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis

Application of Deep Unsupervised Convolutional Neural Networks to Denoise Large Temporally Resolved In Situ TEM Datasets

Nanoparticle Localization Using Gabor Filters

Maximizing Neural Net Generalizability and Transfer Learning Success for Transmission Electron Microscopy Image Analysis in the Face of Small Experimental Datasets

Tomviz: An Open-Source Platform for Electron Tomography

Exploring Local Crystal Symmetry with Rotationally Invariant Variational Autoencoders

Gated Dense Convolutional Neural Networks for Unbalanced Representations in STEM Tomography

On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis

Machine Learning Enabled Reproducible Data Analysis for Electron Microscopy

Autonomous Electron Microscopy Enabling Physics Discovery: Applications in Plasmonics of 2D Systems

Bayesian Optimization for Multi-dimensional Alignment: Tuning Aberration Correctors and Ptychographic Reconstructions

Biotherapeutics Evaluation Using Artificial Intelligence Assisted Image Analysis

Comparison Between Deep Learning and Iterative Bayesian Statistics Deconvolution Methods in Energy Electron Loss Spectroscopy

Diagnostic and Correction of Phase Aberrations in Scanning Transmission Microscopy by Artificial Neural Networks

Machine Learning of In-situ Temperature Reconstruction from Metal-nanoparticle Thermometry on Transmission Electron Microscopy

NanoMi: An Open Source Electron Microscope Component Integration

Neural Architecture Search for Transmission Electron Microscopy: Rapid Automation of Phase and Orientation Determination in TEM images

Spatial Order of Latent Variables to Characterize Multi-range Symmetry Lowering Distortions in a Pd3Bi2Se2 Superconductor

“Push-Button Microscopy”: Automated Instrument Alignment and Reciprocal-space Navigation using PyJEM

Vendor Symposium

Advanced In Situ TEM Nanomechanical Testing Options with the PI-95

Argon Milling of Bulk and Post-FIB Specimens for Multi-Length Scale Analyses by EBSD, TEM, and APT under Controlled Environments

Diffuse Scattering from a RAFA Lens Produced High-Intensity, Far-Focused, Small 3D Virtual Source

Microscopy and Microanalysis

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Volume 28 - April 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis

On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis

Vendor Symposium