Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - April 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis

Approaches Taken to Streamline and Consolidate Large Dataset Processing Techniques, with a Focus on Ptychography

Automation of TEM Alignment using Python Scripting

Classification of Metal Nanoclusters Using Convolutional Neural Networks

Exploring Motifs and Their Hierarchies in Crystals via Unsupervised Learning

Phase-residue Removal Based on Sparse Modeling in Electron Holography

Quantifying Differences Between Machine Learning Classification Models Applied to Cancer Microscopy Data

Artificial Neural Network for Automatic Alignment of Electron Optical Devices

Compressive Hyperspectral Microscopy of Plasmonic Nanoparticles – Noise Characteristics and Performance Limits

Deep Learning Computer Vision for Anomaly Detection in Scanning Transmission Electron Microscopy

Versatile Automated Domain Mapping of 4D-STEM Data Utilizing ML Algorithms and Bayesian Statistics

Convolutional Neural Network as a Solution to Segment and Classify High Resolution TEM Images to Obtain 3D Information

A Semi-Supervised Machine Learning Workflow to Extract Quantitative Insights From Ultrafast Electron Microscopy Datasets

Automation of Supported Nanoparticle Recognition in Low Contrast STEM Images

Development of a Flexible Ensemble Classification System for Microscopy

Electron Image Reconstruction for Pixelated Semiconductor Tracking Detectors Based on Neural Networks

Euclid-NexusLIMS: A Customizable Data Management Software for Microscopists with Cloud Computing Outlook

Synthetic Data for Machine Learning and Novel Edge Detection to Measure Particle Size Distributions in TEM

Understanding the Role of Neural Network Complexity and Receptive Field in Identifying Nanoparticles in TEM Images

4D-STEM Analysis with the Open Source py4DSTEM and crystal4D Toolkits

Strain Mapping from Electron Diffraction Patterns using a Fourier-space Complex Neural Network

Microscopy and Microanalysis

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Volume 28 - April 2022

Cross-Cutting Symposia

Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis