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Python and FPGA-based Workflow for Automated and Interoperable Scanning Probe Microscopy

Published online by Cambridge University Press:  22 July 2022

Shivaranjan Raghuraman*
Affiliation:
Functional Atomic Force Microscopy Group, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Yongtao Liu
Affiliation:
Functional Atomic Force Microscopy Group, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Kyle Kelley
Affiliation:
Functional Atomic Force Microscopy Group, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Rama K. Vasudevan
Affiliation:
Functional Atomic Force Microscopy Group, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Stephen Jesse
Affiliation:
Functional Atomic Force Microscopy Group, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Copyright
Copyright © Microscopy Society of America 2022

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