Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy

Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing

Advancements to the Digital Representation Environment for Analysis of Materials in 3-Dimensions—DREAM.3D

Using Deep Learning to Deconvolute Complex Spectra for Hyperspectral Imaging Applications

Machine Learning for Challenging EELS and EDS Spectral Decomposition

Deep-Learning Based Autofocus Score Prediction of Scanning Electron Microscope

Information theory based crystallographic symmetry classifications of a noisy 2D periodic scanning tunneling microscope image

Iterative Machine Learning Method for Pore-Back Artifact Mitigation in High Porosity Membrane FIB-SEM Image Segmentation

Two-stage Neural Architecture Search for Microscopy Image Segmentation

Deep Learning as a Tool for Image Denoising and Drift Correction

Towards Fast and Direct Memory Read-out by Multi-beam Scanning Electron Microscopy and Deep Learning Image Classification

Machine Learning Approaches for Analysis of Multiscale Imaging Data for Atmospheric and Soil Particles

Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures

Machine Learning and Computer Vision for the Classification of Carbon Nanotube and Nanofiber Structures from Transmission Electron Microscopy Data

Image Registration of Low-Signal-to-Noise STEM Data with Open Source Software

Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis

A Combination of Un-supervised and Supervised Machine Learning Method for Auto-thresholding Scanning Electron Microscopy Images

Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation

Application of Forward Modelling and Dictionary Indexing to EBSD Orientation Data as a Means of Quantifying Dislocation Substructure Formation in FCC Metals

Simulating Thermal Noise for S/TEM Images from Atom Coordinate Data

Expanding the Dimensions of a High Dynamic Range Detector with a Limited Number of Pixels via Scripting

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy