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Application of Forward Modelling and Dictionary Indexing to EBSD Orientation Data as a Means of Quantifying Dislocation Substructure Formation in FCC Metals

Published online by Cambridge University Press:  05 August 2019

Daniel L. Foley
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia. PA, USA.
Cassandra Pate
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia. PA, USA.
Kyle Matthews
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia. PA, USA.
Xingyuan Zhao
Affiliation:
Department of Mechanical Engineering and Mechanics, Drexel University, Philadelphia, PA, USA.
Nicolas Savino
Affiliation:
Department of Mechanical Engineering and Mechanics, Drexel University, Philadelphia, PA, USA.
Marc DeGraef
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, USA.
Leslie Lamberson
Affiliation:
Department of Mechanical Engineering and Mechanics, Drexel University, Philadelphia, PA, USA.
Mitra L. Taheri*
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia. PA, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Follansbee, PS, Metall. Appl. Shock. high strain rate Phenom. 1(1), p. 451.Google Scholar
[2]Gray, GT (Rusty), Annu. Rev. Mater. Res. 42(1) (2012), p. 285.Google Scholar
[3]Rohatgi, A, Vecchio, KS and Gray, GT, Metall. Mater. Trans. A 32(1) (2001),p. 135.Google Scholar
[4]Gutierrez-Urrutia, I and Raabe, D, Mater. Sci. Forum 702–703 (2011), p. 523.Google Scholar
[5]Leff, AC, Weinberger, CR and Taheri, ML, Ultramicroscopy 153 (2015), p. 9.Google Scholar
[6]Singh, S and De Graef, M, Model. Simul. Mater. Sci. Eng. 24(8) (2016).Google Scholar