Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques

Spatially Resolved Soft X-ray Spectroscopy in Scanning X-ray Microscopes

Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents

XAS Between the Stars

Barite Cathodoluminescence as a Potential Indicator of Undiscovered Ore Deposits

Development of LVSEM-EDS Analyzer Utilizing Superconducting X-ray Detector Toward Nanometer-scale Elemental Mapping of CFRP/Adhesive Interface

Detection of Rare Earth Elements in Appalachian Coal Fly Ash by Cathodoluminescence Spectroscopy

A Combined WDS, EDS and Cathodoluminescence Study of Carbonate Grains in Water-Rich Meteorites

Ultrafast SEM

Soft X-ray Emission Spectroscopy of Borosilicate Glasses and Minerals by SXES and EPMA-WDS

Detection of Low Energy X-rays with High Efficiency and Spectral Resolution

Innovative μXRF Mapping of Ore Samples: A Comparison of Novel Synchrotron- and Lab-Based Technology

Recent Developments in Atom Probe Tomography

Exploring New Science Domains with Atom Probe Tomography Enabled by an Environmental Transfer Hub

A Toolchain for the Analysis of Hydrogen in Materials at the Atomic Scale

Comprehensive Analysis of Hydrogen, Deuterium, Tritium and Isotopic Ratios of Other Light Elements in Neutron Irradiated TPBAR Components

Building Laboratory-on-Tip for Imaging Biological Samples with Atom Probe Tomography

Atomistic-Simulation Based Modeling of Atom Probe Tomography

A Mesoscopic Field Evaporation Model

Fast Continuum Models for Atom Probe Simulation and Reconstruction

Interpreting Voids in Atom Probe Tomography Data via Experiment and Theory

Improving Spatial Accuracy in Atom Probe Tomography through a Crystallography-Mediated Reconstruction (CMR)

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques

Recent Developments in Atom Probe Tomography