Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T22:20:00.880Z Has data issue: false hasContentIssue false
  • English
  • Français

Image Registration of Low-Signal-to-Noise STEM Data with Open Source Software

Published online by Cambridge University Press:  05 August 2019

Benjamin H. Savitzky ,
Ismail El Baggari ,
Colin B. Clement ,
Emily Waite ,
Robert Hovden  and
Lena F. Kourkoutis
Benjamin H. Savitzky*
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA.
Ismail El Baggari
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA.
Colin B. Clement
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA.
Emily Waite
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY, USA.
Robert Hovden
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY, USA.
Lena F. Kourkoutis*
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY, USA. Kavli Institute for Nanoscale Science, Cornell University, Ithaca, NY, USA.
*
*Corresponding authors: [email protected] & [email protected]
*Corresponding authors: [email protected] & [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 200 - 201
Copyright
Copyright © Microscopy Society of America 2019 

Footnotes

4

Present address: Dept. of Mater. Sci. and Eng., University of Michigan, Ann Arbor, MI, USA.

5

Present address: NCEM, Molecular Foundry, LBNL, Berkeley, CA, USA.

References

[1]Sang, X and LeBeau, JM, Ultramicroscopy 138 (2014), p. 28.Google Scholar
[2]Berkels, B et al. , Ultramicroscopy 138 (2014), p. 46.Google Scholar
[3]Ophus, C, Ciston, J and Nelson, CT, Ultramicroscopy. 162 (2016), p. 1.Google Scholar
[4]Savitzky, BH et al. , Ultramicroscopy, 191 (2018), p. 56.Google Scholar
[5]Li, X et al. , Nature Methods, 10 (2013), p. 584.Google Scholar
[6]BHS acknowledges support from the NSF GRFP (DGE-1144153). This work was supported by NSF (DMR-1539918, DMR-1429155, DMR-1719875) and DOD AFOSR (FA 9550-16-1-0305). All associated code is open source and freely available at https://github.com/bsavitzky/rigidRegistration, and can be conveniently run through the iPython/Jupyter notebook.Google Scholar