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Information theory based crystallographic symmetry classifications of a noisy 2D periodic scanning tunneling microscope image

Published online by Cambridge University Press:  05 August 2019

Peter Moeck ,
Andrew Dempsey  and
Connor Shu
Peter Moeck
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751
Andrew Dempsey
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751
Connor Shu
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 184 - 185
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Moeck, P., Proc. 11th IEEE Intern. Conf. on Nanotechnology, Portland, August 15-18, 2011, pp. 520–525.Google Scholar
[2]Straton, J. C. et al. , Advanced Structural and Chemical Imaging 1 (2015) paper 14 (12 pages).Google Scholar
[3]Moeck, P., In: Microscopy Book Series No. 7, pp. 503–514, 2017, http://www.microscopy7.org/book/ 503–514.pdf.Google Scholar
[4]Moeck, P., Symmetry 10 (2018) paper 133 (46 pages), open access.Google Scholar
[5]Moeck, P., arXiv:1902.04155, April 2019 (23 pages).Google Scholar
[6]Vasudevan, R. K. et al. , npj Computational Materials 30 (2018) 1–9.Google Scholar
[7]Vasudevan, R. K., private communication, the STM image is freely available as support material of [6].Google Scholar
[8]Moeck, P. and DeStefano, P., Advanced Structural and Chemical Imaging 4 (2018), paper 5 (33 pages).Google Scholar
[9]Kanatani, K., Intern. J. Computer Vision 26 (1998) 171–189.Google Scholar
[10]Moeck, P. and Dempsey, A., this conference proceedings.Google Scholar