Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy

3D Platform for Machine Learning Based Segmentation and Visualization Using FIB-SEM Imagery

Using Neural Networks to Identify Atoms in HRTEM Images

A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data

Extending Monte Carlo Simulations of Electron Microscopy Images and Hyperspectral Images in a User-Friendly Framework

Scanning Electron Microscope 3D Surface Reconstruction via Optimization

First Auto-Magnifier Platform for Hardware Assurance and Reverse Engineering Integrated Circuits

Processing Structurally Heterogeneous Cryo-EM Data Using Atomic Models

The Effect of Nonuniform Pixel Responses in CCD on Quantitative Analysis

Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control

Real-Time Data Processing using Python in DigitalMicrograph

Novel SEM and DualBeam experiments with Python

Workshop App: the Data Analysis Design Pattern of the Enabler Framework

How Does the Internal Structure of Cardiac Muscle Cells Regulate Cellular Metabolism?

Evaluation of Crystal Lattice Rotation around a Stress-Induced Twin in a Step-Graded SiGe / Si (110) Using STEM Moiré Observation and its Image Analysis

Measurand-Optimized, Content-Aware Scanning Electron Microscopy

Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques

Fast Hyperspectral Soft X-Ray Mapping

Information of Valence Charge of 3d Transition Metal Elements Observed in L-Emission Spectra

The Impact of Phase on Mass Absorption Coefficients Using Soft X-ray Emission Spectrometry

An EPMA Study of the Soft Fe Lα-Lβ X-ray lines in Fe-silicide, Olivine and Fe-sulfide Minerals by SXES and WDS

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy

Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques