Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy

Fuzzy Clustering to Merge EDS and EBSD Datasets with Crystallographic Ambiguity

Utilizing an Open-Source Workflow for the Analysis of Atom Dynamics in Two-Dimensional Materials

Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis

Harvesting Microscopy Experimental Context with a Configurable Laboratory Information Management System

ImageJ for the Next Generation of Scientific Image Data

Semantic SEM Image Segmentation of Concrete with Contextual Labels

Enhancement for MAINMAST, De Novo Main-Chain Tracing Method: Symmetric Multi-Chain Modeling, Local Refinement, and Graphical User Interface

Comparison of Techniques for Fine Alignment of Image Stacks in Serial Block-Face Electron Microscopy

Machine Learning for High Throughput HRTEM Analysis

Performance Analysis of Interaction-Free-Measurement-based Electron Microscopy

An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation

Statistical Machine Learning and Compressed Sensing Approaches for Analytical Electron Tomography - Application to Phase Change Materials

Deep Learning for Sparse Scanning Electron Microscopy

Maximal Resolution from the Ronchigram: Human vs. Deep Learning

Dynamic Random Scan Approach of Spectrum Imaging for Temporal Evolution of Spectroscopic Signals

DefectNet – A Deep Convolutional Neural Network for Semantic Segmentation of Crystallographic Defects in Advanced Microscopy Images

Automated Real-time Analysis of Atomic-resolution STEM Images

Merging Deep Learning, Chemistry, and Diffraction for High-Throughput Material Structure Prediction

FerroNet: Machine Learning Flow for Analysis of Ferroelectric and Ferroelastic Materials

Deep Learning Enabled Measurements of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-Picometer Precision

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy