Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Recent Developments in Atom Probe Tomography

Bridging Reciprocal and Direct Space by Using the Small-Angle Scattering Formalism for Atom Probe Tomography

Multiplicity vs. Composition Study to Understand the Field Evaporation of Polar AlxGa1−xN Heterostructures: A New Approach

On Strong Scaling Open Source Tools for Mining Atom Probe Tomography Data

Modularity Optimization for Fast Automated Detection of Solute Clusters in Atom Probe Tomography

Improved Data Analysis with IVAS 4 and AP Suite

An Atomic Renaissance For Pulsed Field Ion Microscopy

An Integrated Workflow To Investigate Electrocatalytic Surfaces By Correlative X-ray Photoemission Spectroscopy, Scanning Photoemission Electron Microscopy and Atom Probe Tomography

In situ HR-TEM and Simulation of Si Field Emitter Tips under Field Evaporation

Understanding Fundamental Processes on Au-Ag Catalysts during Oxidation Reactions: a Correlative Microscopy Approach

Opportunities and Challenges in APT Metrology for Semiconductor Applications

Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source

Using a Plasma FIB Equipped with Xe, N2, O2 and Ar for Atom Probe Sample Preparation – Ion Implantation and Success Rates

Direct Observation of Zirconium Alloy Oxidation at the Nanoscale

Mechanical Precision Preparation of Atom Probe Tips

Imaging Belgian Chocolate by Field Ion Microscopy

Hough Transform Based Accurate Composition Extractions From Correlation Histograms in Atom Probe Tomography

Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography

Investigation of Microstructure and Dispersoids/Precipitates in Additively Manufactured Aluminum Alloys

Surface/Subsurface Interactions During Rh Oxidation Revealed by Atom Probe Tomography and Microscopy

Interpreting the Simplified Multicomponent Short-Range Order Parameter

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Recent Developments in Atom Probe Tomography