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Iterative Machine Learning Method for Pore-Back Artifact Mitigation in High Porosity Membrane FIB-SEM Image Segmentation

Published online by Cambridge University Press:  05 August 2019

Joseph Tracey ,
Sam Sheng Lin ,
Jasna Jankovic ,
Aiden Zhu  and
Shawn Zhang
Joseph Tracey
Affiliation:
Materials Science and Engineering Department, University of Connecticut, Storrs, Connecticut, USA.
Sam Sheng Lin
Affiliation:
DigiM Solution LLC, Burlington, Massachusetts, USA.
Jasna Jankovic
Affiliation:
Materials Science and Engineering Department, University of Connecticut, Storrs, Connecticut, USA.
Aiden Zhu
Affiliation:
DigiM Solution LLC, Burlington, Massachusetts, USA.
Shawn Zhang
Affiliation:
DigiM Solution LLC, Burlington, Massachusetts, USA.

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 186 - 187
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zhang, S. et al. , Microscopy Today 27 (2019). doi:10.1017/S1551929519000026Google Scholar
[2]Dravid, A, Microscopy Today 27(1) (2019), p. 18.Google Scholar