Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Ultrafast Transmission Electron Microscopy with nanoscale Photoemitters

Observing Liquid Flow in Nanotubes

Ultrabright Femtosecond Electron Sources: Ultrafast Structural Dynamics in Labile Organic Crystals

Development of MeV Ultrafast Electron Scattering Instruments at SLAC National Accelerator Laboratory

A06 Advanced Analytical TEM/STEM

Abstract

Inconsistent Normalized Intensities for Quantitative STEM: Detector Scans and Single Electron Counting

Quantitative Annular Dark-Field Imaging of Single-Layer Graphene

Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging

Correction of Linear and Nonlinear Raster Distortion from Orthogonal Image Pairs

Ptychographic Imaging in an Aberration Corrected STEM

Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM

Characterizing Atomic Ordering of High Entropy Alloys Using Super-X EDS Characterization

Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis

Gold and Arsenopyrite Exsolution and Limits of Arsenic Solubility in Pyrite Investigated by SEM, EPMA, and L-ICPMS

Characterization of Stannous Fluoride Uptake in Human Dentine by Super-X XEDS and Dual-EELS analysis

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Three-Dimensional Imaging of Point Defects in Functional Materials Using Quantitative STEM

Removing Elastic Scattering Effects from Chemical Maps Taken under Incoherent Conditions

Identifying Atomic Reconstruction at Complex Oxide Interfaces Using Quantitative STEM

Revealing Unit Cell Level Distortions in Random Oxide Solid Solutions by Scanning Transmission Electron Microscopy and the Projected Pair Distribution Function

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Decomposing Electron Diffraction Signals in Multi-Component Microstructures

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract