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Characterizing Atomic Ordering of High Entropy Alloys Using Super-X EDS Characterization

Published online by Cambridge University Press:  23 September 2015

Robert E. A. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA Center for Accelerated Maturation of Materials, 1305 Kinnear Road, Columbus, OH 43212, USA
Brian Welk
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA Center for Accelerated Maturation of Materials, 1305 Kinnear Road, Columbus, OH 43212, USA
Jake Jensen
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA Center for Accelerated Maturation of Materials, 1305 Kinnear Road, Columbus, OH 43212, USA
Bryan D. Esser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
David W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Hamish L. Fraser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA Center for Accelerated Maturation of Materials, 1305 Kinnear Road, Columbus, OH 43212, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Cantor, B., et al, Materials Science and Engineering: A 375 (2004). p. 213218.Google Scholar
[2] Yeh, J-W., et al, Advanced Engineering Materials 6 (no. 5 2004). p. 299303.CrossRefGoogle Scholar
[3] Yeh, J-W., et al, Metall Mater Trans A 35 (2010). p. 2533.Google Scholar
[4] Hou, D. H., et al, Philosophical Magazine A 74(3), (1996). p. 741760.Google Scholar
[5] Forbes, B. D., et al, Physical Review B 86(2 (2012) 024108.Google Scholar
[6] Lugg, N. R., et al, Applied Physics Letters 101(18 (2012) 183112.Google Scholar
[7] Allen, L. J. & Findlay, S. D. Ultramicroscopy in press 2014.Google Scholar
[8] Kothleitner, G., et al, Physical Review Letters 112(8 (2014) 085501.Google Scholar