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Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging

Published online by Cambridge University Press:  23 September 2015

Lewys Jones ,
Richard Beanland ,
Sergio Lozano-Perez ,
Karim Baba-kishi  and
Peter D. Nellist
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Richard Beanland
Affiliation:
Department of Physics, University of Warwick, Coventry, UK
Sergio Lozano-Perez
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Karim Baba-kishi
Affiliation:
Department of Applied Physics, Hong Kong Polytechnic University, Hong Kong
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1215 - 1216
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Egerton, R., Li, P. & Malac, M., Micron 35 (2004), p 399–409.CrossRefGoogle Scholar
[2] Jones, L. & Nellist, P. D., Microscopy & Microanalysis 19 (2013), p 1050–1060.Google Scholar
[3] Demo code available free of charge for academic / non-commercial use at www.lewysjones.com.Google Scholar
[4] This research was supported by the European Union Grant Agreement 312483 - ESTEEM2.Google Scholar