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Removing Elastic Scattering Effects from Chemical Maps Taken under Incoherent Conditions

Published online by Cambridge University Press:  23 September 2015

Y Zhu ,
H Tan ,
HL Xin ,
A Soukiassian ,
DG Schlom ,
DA Muller  and
C Dwyer
Y Zhu
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia
H Tan
Affiliation:
CEMES-CNRS, Universite’ de Toulouse, nMat Group, BP94347, 31055, Toulouse Cedex 4, France
HL Xin
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973, USA
A Soukiassian
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA
DG Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA
DA Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA
C Dwyer
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Peter Gruenberg Institute, Forschungszentrum Juelich, Juelich 52425, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1235 - 1236
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Zhu, Y, Soukiassian, A, Schlom, DG, Muller, DA & Dwyer, C, Appl. Phys. Lett. 103 (2013) 141908.Google Scholar
[2] Tan, H, Zhu, Y, Dwyer, C & Xin, HL, Phys. Rev. B 90 (2014) 214305.Google Scholar