Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

Growth of Transition Metal Oxides in Solution under Liquid Cell Electron Microscopy and Electron Beam Effects

The Stability of Gold Nanoparticles in Liquid Scanning Transmission Electron Microscopy Experiments Studied under Varied Conditions

Automated and Shaped-Controlled Liquid STEM Nanolithography

Manipulating Size and Shape of Silica Nanoparticles with Liquid-Phase Transmission Electron Microscopy

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

Materials Science Applications of Aberration Corrected TEM and/or STEM

50pm Aberration Corrected In-situ Electron Microscopy - How Ion behaves in Lithium Ion Nanowire Battery

Depth-Resolution Imaging of Crystalline Nano Clusters on/in Amorphous Films Using Aberration-Corrected TEM

Strain Control at Two-Dimensional Oxide Interfaces Probed by Aberration-Corrected STEM-EELS

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

The Use of Auger Spectroscopy for the Elemental Analysis of Presolar Silicate Grains

Practical Aspects of the Electron Probe Analysis of Boron in Silicates using a LSM Device with Large 2d

CHILI, a Nanobeam Secondary Neutral Mass Spectrometer with Extraordinary Spatial Resolution, Sensitivity, and Selectivity: First Results

Electron Microprobe Analysis of Complex Y-REE-Ta-Nb-Ti Minerals from the Petaca Pegmatite District, New Mexico

P04 Nano-Characterization of Low Dimensional Materials: Carbon to 2D TMDs

Abstract

Exploring Low-dimensional Carbon Materials by High-resolution Electron and Scanned Probe Microscopy

Towards the Electron Spectroscopy Graphene Fingerprint

STEM and EELS study of the Graphene/Bi2Se3 Interface

Core Structure of Dissociated Dislocations in Bi2Te3 Nanowires

Fabrication and Simultaneous Electrical Measurement of Graphene Nanoribbon Devices Inside a S/TEM

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Abstract

Kink Band Formation in High-strength Bulk Metallic Nanolaminates

Nanostructures Formation in Al-B4C Neutron Absorbing Materials after Accelerated Irradiation and Corrosion Tests

A Study of Glass Composition and Crizzling in Two Claude Laurent Glass Flutes from the Library of Congress

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

P04 Nano-Characterization of Low Dimensional Materials: Carbon to 2D TMDs

Abstract

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Abstract