Proceedings of Microscopy & Microanalysis 2015
Analytical and Instrumentation Science Symposia
A06 Advanced Analytical TEM/STEM
Abstract
Quantitative EDS of Surface Modified Pd Powders for Hydrogen Storage
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- 23 September 2015, pp. 1083-1084
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A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques
Abstract
Computational Method for Composition Determination of Multilayer Epitaxial Semiconductor Structures Using Standards-Based Energy-Dispersive X-Ray Spectrometry
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- 23 September 2015, pp. 1085-1086
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Practical Considerations in Quantitative Nanoscale Energy-Dispersive X-ray Spectroscopy (EDX) and Its Application in SiGe
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- 23 September 2015, pp. 1087-1088
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Quantification of Phase Compositions and Diffusional Profiles in Simulated Solid-State Welds of Ti-17 via Super-X Energy-Dispersive X-Ray Spectroscopy
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- 23 September 2015, pp. 1089-1090
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Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors
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- 23 September 2015, pp. 1091-1092
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Influence of Convergence Angle and Finite Effective Source Size for Quantitative Atomic Resolution EDXS
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- 23 September 2015, pp. 1093-1094
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A10 Advances in Electron Diffraction and Automated Mapping Techniques
Abstract
TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination
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- 23 September 2015, pp. 1095-1096
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Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED
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- 23 September 2015, pp. 1097-1098
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Mapping Valence Electron Distribution of Iron-Based Superconductors using Quantitative CBED and Precession Electron Diffraction
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- 23 September 2015, pp. 1099-1100
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Transmission Kikuchi Diffraction (TKD)via a horizontally positioned detector
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- 23 September 2015, pp. 1101-1102
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Utility of Precession Electron Diffraction Patterns with Varying Degrees of Non-parallel Illumination from the Same Nominal Sample Area
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- 23 September 2015, pp. 1103-1104
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A16 Advances in Electron and Ion Scanning Microscopies
Abstract
Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope
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- 23 September 2015, pp. 1105-1106
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Variation in Band Gap Contrast in Natural Molybdenum Disulphide (MoS2) with BSE Collection Angle and Stage Bias using a Segmented Annular BSED
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- 23 September 2015, pp. 1107-1108
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Monte Carlo Simulations of Signal Electrons Collection Efficiency and Development of New Detectors for ESEM
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- 23 September 2015, pp. 1109-1110
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Electron Microscopy in Air: Transparent Atomic Membranes and Imaging Modes
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- 23 September 2015, pp. 1111-1112
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Advances In Variable Pressure Imaging and Detection
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- 23 September 2015, pp. 1113-1114
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Biological Science Symposia
B04 Advances in Specimen Preparation and Correlative LM-EM (CLEM) of Biological Samples
Abstract
Quick Freeze Substitution Processing of Biological Samples for Serial Block-face Scanning Electron Microscopy
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- 23 September 2015, pp. 1115-1116
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The Acquisition of Large Datasets with Serial-Block Face Scanning Electron Microscopy following Light Microscopy Image Acquisition: Workflows from Sample Preparation to Image Acquisition
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- 23 September 2015, pp. 1117-1118
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In Situ Tomography of Membrane Proteins Enabled by Advanced Cryo-FIB Sample Preparation and Phase Plate Imaging
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- 23 September 2015, pp. 1119-1120
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Imaging of Vitrified Biological Specimens by Confocal Cryo-Fluorescence Microscopy and Cryo-FIB/SEM Tomography
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- 23 September 2015, pp. 1121-1122
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