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Inconsistent Normalized Intensities for Quantitative STEM: Detector Scans and Single Electron Counting

Published online by Cambridge University Press:  23 September 2015

Xiahan Sang  and
James M. LeBeau
Xiahan Sang
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NC 27606
James M. LeBeau
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NC 27606

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1211 - 1212
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] LeBeau, J. M. & Stemmer, S., Ultramicroscopy 108 (2008), p. 1653.Google Scholar
[2] Ishikawa, R., et al, Microscopy and Microanalysis 20 (2014), p. 176.Google Scholar
[3] The authors acknowledge the use and support of the Analytical Instrumentation Facility at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation.Google Scholar