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Quantitative Annular Dark-Field Imaging of Single-Layer Graphene

Published online by Cambridge University Press:  23 September 2015

Shunsuke Yamashita ,
Shogo Koshiya ,
Kazuo Ishizuka  and
Koji Kimoto
Shunsuke Yamashita
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan Department of Applied Chemistry, Kyushu University, 1-1 Namiki, Tsukuba, Ibaraki, Japan
Shogo Koshiya
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan
Kazuo Ishizuka
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan HREM Research Inc., 14-48 Matsukazedai, Higashimatsuyama, Saitama, Japan
Koji Kimoto
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan Department of Applied Chemistry, Kyushu University, 1-1 Namiki, Tsukuba, Ibaraki, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1213 - 1214
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] LeBeau, J M & Stemmer, S, Ultramicroscopy 108 (2008), p. 1653.CrossRefGoogle Scholar
[2] Yamashita, S, et al, Microscopy (2015) in press( doi: 10.1093/jmicro/dfu115).CrossRefGoogle Scholar
[3] This study was partly supported by the JST Research Acceleration Program and the Nano Platform Program of MEXT, Japan. The authors thank Dr. Nagai, Mr. Kurashima and Ms. Ohwada for support in the STEM experiments.Google Scholar