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Stress Modulated Composition Fluctuation and Diffusion in near lattice match AlInN/GaN

Published online by Cambridge University Press:  26 July 2009

A Mouti ,
J-L Rouvière ,
Nicolas Grandjean  and
Pierre Stadelmann
A Mouti
Affiliation:
Interdisciplinary Center of Electron Microscopy (CIME), Swiss Federal Institute of Technology (EPFL)
J-L Rouvière
Affiliation:
CEA Grenoble, Department of Fundamental Research on Condensed Matter
Nicolas Grandjean
Affiliation:
Laboratory of Advanced Semiconductors for Photonics and Electronics (LASPE), EPFL
Pierre Stadelmann
Affiliation:
Interdisciplinary Center of Electron Microscopy (CIME), Swiss Federal Institute of Technology (EPFL)

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1020 - 1021
Copyright
Copyright © Microscopy Society of America 2009