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Low Loss EELS Study of the Ultrathin SrTiO3 Film Grown on the Si Single Crystal

Published online by Cambridge University Press:  26 July 2009

D Su ,
M Couillard ,
M Sawicki ,
C Broadbridge  and
Y Zhu
D Su
Affiliation:
Brookhaven National Laboratory
M Couillard
Affiliation:
Semiconductor Insights,Inc
M Sawicki
Affiliation:
Southern Connecticut State University
C Broadbridge
Affiliation:
Southern Connecticut State University
Y Zhu
Affiliation:
Brookhaven National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1040 - 1041
Copyright
Copyright © Microscopy Society of America 2009