Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-19T20:45:34.620Z Has data issue: false hasContentIssue false
  • English
  • Français

Growth and Structural Characterization of Multiferroic Thin Films and Nanopatterns

Published online by Cambridge University Press:  26 July 2009

S Xie ,
Z Pan ,
J Cheng ,
G Sterbinsky ,
B Wessels  and
VP Dravid
S Xie
Affiliation:
Northwestern University
Z Pan
Affiliation:
Northwestern University
J Cheng
Affiliation:
Northwestern University
G Sterbinsky
Affiliation:
Northwestern University
B Wessels
Affiliation:
Northwestern University
VP Dravid
Affiliation:
Northwestern University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1026 - 1027
Copyright
Copyright © Microscopy Society of America 2009