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Domain Structure Control of BiFeO3 Films Through Substrate Symmetry and Film Thickness

Published online by Cambridge University Press:  26 July 2009

CT Nelson ,
Y Zhang ,
CM Folkman ,
CB Eom ,
JF Mansfield  and
XQ Pan
CT Nelson
Affiliation:
University of Michigan
Y Zhang
Affiliation:
University of Michigan
CM Folkman
Affiliation:
University of Wisconsin
CB Eom
Affiliation:
University of Wisconsin
JF Mansfield
Affiliation:
University of Michigan
XQ Pan
Affiliation:
University of Michigan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1030 - 1031
Copyright
Copyright © Microscopy Society of America 2009