Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

EBSD Performed “In-Situ” on a Dual-Beam FIB

Enhanced Site specific Preparation of SEM Cross Sections and TEM Samples by using CrossBeam Technology

Identification of Cleavage Origins Using Focused Ion Beam (FIB) Sectioning

A Site- and Layer-Specific Sample Preparation Technique for Plan View TEM of Laser Diodes

3D Microscopy and Microanalysis of Heterogeneous SEM Samples by Broad Ion Beam Processing: Cutting - Etching - Coating

Deformation of in xGa1-xas Superlattices Under Bending and Nanoindentation

Auger Analysis Of Focused Ion Beam Prepared Lift -Out Specimens

Focused Ion Beam (FIB) Microscopy and Technology

Marriage Of Focused and Broad Ion Beam: Sample Preparation Optimized for High Performance Analytical (S)TEM

Application of FIB and TEM for the Characterization of Dewetting Behavior on Ceramics

Planarization Processes for Pre-FIB Sample Preparation

“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation

Applications (Fun and Practical) of FIB Nano-Deposition and Nano-Machining

EELS Measurements on Wurtzite InN

The Electronic Structure of Threading Dislocations in GaN

New Developments In EELS Applied To Interface Study In Magnetoresistive Tunnel Junctions With Manganites

Artificial Charge Modulations in La-doped SrTiO3 Superlattices

Atomic Scale Models for Grain Boundary Potentials in Perovskites

Probing the Metal-Insulator Transitions in Complex Oxides with EELS Near- Edge Structures

Analysis of 4 d Transition Metal Oxides by EELS

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract