Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM

Performance and First Results of a New 200 kV FEG-EFTEM

A Simple Internal Active Field Compensator For Post Column Spectrometers

New Approach to Obtain Elemental Maps by Using Energy-Filterd Images

Improvements in Spatially Resolved Characterization Using Eels and Eftem Spectrum-Image Datasets

Characterisation of Exsolution Phenomena by Mapping Eels Fine Structure

Combining Eels and Angle-Resolved Aes to Measure Shallow Profiles of Thin Nitrided Oxide Films on Si

Background Removal and Data Analysis for Low-Loss Transmission Electron Energy-Loss Spectroscopy

In Situ Determination of Local Ce Oxidation States During Redox Reactions

Comparison of ELNES and NEXAFS of vanadium oxide V2O5 with different spectral resolution

Observation of Non-uniformities in Calcium Aluminosilicate Glass using EELS

Chemical Bonding Analysis of AlN Polytypes by ELNES

Exelfs and Exafs: Complementary Probes into the Structure of Metallic Glasses

Characterization of Boron Containing Graphite Using TEM and EELS

Performance of Corrected Imaging Energy Filters

A New High Stability, 4th Order Aberration Corrected Spectrometer and Imaging Filter for a Monochromated Tem

Parallel EELS characterization of TiC commercial powder

AEM Investigation of Strontium Substituted La-Co-Perovskites

Optimizing EELS data sets using ‘a priori’ spectrum simulation

Contributions of Inelastically Scattered Electrons to Defect Images

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract