Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

HREM Study of Fullerenes Impact in a Metallic Matrix

A New Computerised Method of Multiple Labelling Detection and Particle Evaluation

Confocal Holography

Phase Retrieval, Symmetrization Rule and Transport-of-Intensity Equation in Application to Induction Mapping of Magnetic Materials

Image interpretation of magnetic domains in Nd2Fe14B hard magnets

Observation of Chain Structure of Superconducting Vortices by Lorentz Microscopy

Practical Considerations for Electron Holography on Doped Semiconductor Devices

Quantitative Examination of Reverse-Biased Semiconductor Devices using Off- Axis Electron Holography

Low Voltage Nanotip Interferometry

Development of a Direction-Free Magnetic Field Application System

Eleven Thousand Interference Fringes by 1-MV Field Emission Electron Microscope

Observation of Vortices and Columnar Defects by Using Lorentz Microscopy

Phase Contrast Images of Superconducting Pancake Vortices

Vortex Modeling in High-Tc Anisotropic Materials

Fast and Robust Phase Unwrapping Algorithm for Electron Holography

Quantitative Phase Imaging and Differential Interference Contrast for Biological TEM

Holographic Setup for 2D-Dopant Profiling using the Lorentz-Lens

Ferroelectric Electron Holography

Improved Information Recovery in Phase Contrast EM for non-two-fold symmetric Boersch phase plate geometry

FIB Preparation of Mesa Structures for SIMS Analysis

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract