Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

Electron Energy Loss Spectroscopy Study of NbC Precipitates in an Ultra-Low Carbon Hot-Rolled Microalloyed Steel

Further Applications of Energy Filtered TEM in Semiconductor Devices

Electron Beam Induced Damage in Wurtzite InN

A Next Generation Imaging Filter for High Voltage Electron Microscopy

A Faster Approach to Spectrum Imaging and Elemental Mapping in Stem

Chromophore Mapping via Low-Energy Loss Imaging in a Modified EM902: Formation of the Immune Synapse

Localization of Low Energy Losses and the Mixed Dynamic Form Factor

An EFTEM Study of Polyimide Adhesion to Single-Walled Carbon Nanotube Bundles

Transition Edge Sensor Fabrication

Detectors Capable Of High Countrates and High Speed Pulse Processing Electronics for X-Ray Spectroscopy

Development of A High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope

XML for Microanalysis: EMSA/MAS Spectrum File Format 2.0?

Spectral image analysis: Getting the most from all that data

Structure Factor Phase and Amplitude Measurement in Aln by Qcbed

Effect of Anisotropic Lattice Vibration in CBED Intensities and Detection of Local Change in Oxygen Deficiency of YBa2Cu3O7-x

A Study of Bonding in Copper by QCBED Measurements

Automated Crystallography and Grain Mapping in the TEM

Progress towards Quantitative Electron Nanodiffraction

On the Amplitude Origin Problem in Dynamical Direct Methods

Why does the hkl: h+k+l = 4n+2 reflections reveal intensity in Si [110]?

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract