Hostname: page-component-7bb8b95d7b-wpx69 Total loading time: 0 Render date: 2024-10-02T00:39:52.118Z Has data issue: false hasContentIssue false
  • English
  • Français

Focused Ion Beam (FIB) Microscopy and Technology

Published online by Cambridge University Press:  01 August 2002

P. E. Russell  and
F. A. Stevie
P. E. Russell
Affiliation:
Analytical Instrumentation Facility, Room 318 EGRC, Campus Box 7531, North Carolina State University, Raleigh, NC 27695-7531
F. A. Stevie
Affiliation:
Analytical Instrumentation Facility, Room 318 EGRC, Campus Box 7531, North Carolina State University, Raleigh, NC 27695-7531

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 558 - 559
Copyright
Copyright © Microscopy Society of America 2002