Microscopy and Microanalysis: Volume 8 - Issue S02

Only show content I have access to (813)

Over 3 years (818)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 8 - Issue S02 - August 2002

Abstract

Crystallographic Analysis of Orientational Variants in PbZr0.52Ti0.48O3 Ferroelectric Perovskite

Microstructure of Thick Polycrystalline Silicon Films for MEMS Application

Systematic Characterization of Reciprocal Space by SAED: Advantages of a Double-Tilt, Rotate Holder

EBSD Spatial Resolution in the SEM when Analyzing Small Grains or Deformed Material

A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging verses Diffraction Techniques

Microstructure of TiN Coatings by EBSD Techniques

Orientation Analysis of Ultra-fine Grained Bulk Materials Produced by Accumulative Roll-bonding (ARB) Process by the Use of EBSP Technique

Application of Orientation Imaging Microscopy in the TEM to studies of nano-crystalline materials

Determination of Activated Slip Systems in Experimentally Deformed Olivine- Orthopyroxene Polycrystals using EBSD

Chemistry Assisted Phase Differentiation in Automated Electron Backscatter Diffraction

Misorientation Mapping for Visualization of Plastic Strain Via Electron Back-Scattered Diffraction

A New Method for Analyzing Electron Backscatter Diffraction (EBSD) Data for Texture using Inverse Pole Figures

The Random Orientation Probability in Consecutive Inverse Pole Figure Method for Texture Determination

Another Way to Implement Diffraction Contrast in SEM

Alternatives to Image Quality (IQ) Mapping in EBSD

Comparison of OIM and XRD Texture Determinations in a Deformation Processed β-Ti +Y Metal-Metal Composite

Ebsd Characterization of Texture in Tungsten-Rhenium Foils

Electron Back-Scattered Diffraction Misorientation Mapping Applied to Stress Corrosion Cracking of Stainless Steels

EBSD Study of Martensite in a Dual Phase Steel

Development of a Simulation Tool for “Real World” SEM Applications

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 8 - Issue S02 - August 2002

Abstract